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System On Chip Test Architectures

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System on Chip Test Architectures

System on Chip Test Architectures Book
Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
Release : 2010-07-28
ISBN : 9780080556802
Language : En, Es, Fr & De

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Book Description :

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Introduction to Advanced System on Chip Test Design and Optimization

Introduction to Advanced System on Chip Test Design and Optimization Book
Author : Erik Larsson
Publisher : Springer Science & Business Media
Release : 2006-03-30
ISBN : 0387256245
Language : En, Es, Fr & De

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Book Description :

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Design and Test Technology for Dependable Systems on chip

Design and Test Technology for Dependable Systems on chip Book
Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
Publisher : IGI Global
Release : 2011-01-01
ISBN : 1609602145
Language : En, Es, Fr & De

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Book Description :

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

VLSI SOC From Systems to Chips

VLSI SOC  From Systems to Chips Book
Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
Publisher : Springer
Release : 2006-08-16
ISBN : 0387334033
Language : En, Es, Fr & De

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Book Description :

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show research results in the field of microelectronics design. The current trend toward increasing chip integration brings about exhilarating new challenges both at the physical and system-design levels: this conference aims to address these exciting new issues. The 2003 edition of VLSI-SoC conserved the traditional structure, which has been successful in previous editions. The quality of submissions (142 papers) made the selection process difficult, but finally 57 papers and 14 posters were accepted for presentation in VLSI-SoC 2003. Submissions came from Austria, Bulgaria, Brazil, Canada, Egypt, England, Estonia, Finland, France, Germany, Greece, Hungary, India, Iran, Israel, Italy, Japan, Korea, Malaysia, Mexico, Netherlands, Poland, Portugal, Romania, Spain, Sweden, Taiwan and the United States of America. From 57 papers presented at the conference, 18 were selected to have an extended and revised version included in this book.

SOC System on a Chip Testing for Plug and Play Test Automation

SOC  System on a Chip  Testing for Plug and Play Test Automation Book
Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Release : 2013-04-17
ISBN : 1475765274
Language : En, Es, Fr & De

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Book Description :

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Advances in Electronic Testing

Advances in Electronic Testing Book
Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
Release : 2006-01-22
ISBN : 0387294090
Language : En, Es, Fr & De

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Book Description :

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

System on Chip

System on Chip Book
Author : Bashir M. Al-Hashimi
Publisher : IET
Release : 2006-01-01
ISBN : 0863415520
Language : En, Es, Fr & De

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Book Description :

System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings. The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts in the field. This book covers the general principles of designing, validating and testing complex embedded computing systems and their underlying tradeoffs. The book has twenty five chapters organised into eight parts, each part focuses on a particular topic of SoC. Each chapter has some background covering the basic principles, and extensive list of references. It is aimed at graduate students, designers and managers working in Electronic and Computer engineering.

VLSI SoC Advanced Topics on Systems on a Chip

VLSI SoC  Advanced Topics on Systems on a Chip Book
Author : Ricardo Reis,Vincent Mooney,Paul Hasler
Publisher : Springer
Release : 2009-04-05
ISBN : 0387895582
Language : En, Es, Fr & De

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Book Description :

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.

Essential Issues in SOC Design

Essential Issues in SOC Design Book
Author : Youn-Long Steve Lin
Publisher : Springer Science & Business Media
Release : 2007-05-31
ISBN : 1402053525
Language : En, Es, Fr & De

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Book Description :

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

Reliability Availability and Serviceability of Networks on Chip

Reliability  Availability and Serviceability of Networks on Chip Book
Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
Publisher : Springer Science & Business Media
Release : 2011-09-23
ISBN : 9781461407911
Language : En, Es, Fr & De

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Book Description :

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures Book
Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
Publisher : Elsevier
Release : 2006-08-14
ISBN : 9780080474793
Language : En, Es, Fr & De

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Book Description :

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Power Aware Testing and Test Strategies for Low Power Devices

Power Aware Testing and Test Strategies for Low Power Devices Book
Author : Patrick Girard,Nicola Nicolici,Xiaoqing Wen
Publisher : Springer Science & Business Media
Release : 2010-03-11
ISBN : 1441909281
Language : En, Es, Fr & De

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Book Description :

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs

Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs Book
Author : Brandon Noia,Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Release : 2013-11-19
ISBN : 3319023780
Language : En, Es, Fr & De

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Book Description :

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

Information and Business Intelligence

Information and Business Intelligence Book
Author : Xilong Qu,Chenguang Yang
Publisher : Springer
Release : 2012-04-25
ISBN : 3642290841
Language : En, Es, Fr & De

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Book Description :

This two-volume set (CCIS 267 and CCIS 268) constitutes the refereed proceedings of the International Conference on Information and Business Intelligence, IBI 2011, held in Chongqing, China, in December 2011. The 229 full papers presented were carefully reviewed and selected from 745 submissions. The papers address topics such as communication systems; accounting and agribusiness; information education and educational technology; manufacturing engineering; multimedia convergence; security and trust computing; business teaching and education; international business and marketing; economics and finance; and control systems and digital convergence.

The VLSI Handbook

The VLSI Handbook Book
Author : Wai-Kai Chen
Publisher : CRC Press
Release : 2018-10-03
ISBN : 1420005960
Language : En, Es, Fr & De

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Book Description :

For the new millenium, Wai-Kai Chen introduced a monumental reference for the design, analysis, and prediction of VLSI circuits: The VLSI Handbook. Still a valuable tool for dealing with the most dynamic field in engineering, this second edition includes 13 sections comprising nearly 100 chapters focused on the key concepts, models, and equations. Written by a stellar international panel of expert contributors, this handbook is a reliable, comprehensive resource for real answers to practical problems. It emphasizes fundamental theory underlying professional applications and also reflects key areas of industrial and research focus. WHAT'S IN THE SECOND EDITION? Sections on... Low-power electronics and design VLSI signal processing Chapters on... CMOS fabrication Content-addressable memory Compound semiconductor RF circuits High-speed circuit design principles SiGe HBT technology Bipolar junction transistor amplifiers Performance modeling and analysis using SystemC Design languages, expanded from two chapters to twelve Testing of digital systems Structured for convenient navigation and loaded with practical solutions, The VLSI Handbook, Second Edition remains the first choice for answers to the problems and challenges faced daily in engineering practice.

SOC Design Methodologies

SOC Design Methodologies Book
Author : Michel Robert,Bruno Rouzeyre,Christian Piguet,Marie-Lise Flottes
Publisher : Springer
Release : 2013-03-15
ISBN : 0387355979
Language : En, Es, Fr & De

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Book Description :

The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big challenge for designers, as a SOC may contain very different blocks, such as microcontrollers, DSPs, memories including embedded DRAM, analog, FPGA, RF front-ends for wireless communications and integrated sensors. The complete design of such chips, in very deep submicron technologies down to 0.13 mm, with several hundreds of millions of transistors, supplied at less than 1 Volt, is a very challenging task if design, verification, debug and industrial test are considered. The microelectronic revolution is fascinating; 55 years ago, in late 1947, the transistor was invented, and everybody knows that it was by William Shockley, John Bardeen and Walter H. Brattein, Bell Telephone Laboratories, which received the Nobel Prize in Physics in 1956. Probably, everybody thinks that it was recognized immediately as a major invention.

Algorithms in Ambient Intelligence

Algorithms in Ambient Intelligence Book
Author : W. Verhaegh,Wim Verhaegh,Emile Aarts,Jan Korst
Publisher : Springer Science & Business Media
Release : 2004
ISBN : 9781402017575
Language : En, Es, Fr & De

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Book Description :

This book is the outcome of a series of discussions at the Philips Symposium on Intelligent Algorithms, which was held in Eindhoven on December 2002. It contains many exciting and practical examples from this newly developing research field, which can be positioned at the intersection of computer science, discrete mathematics, and artificial intelligence. The examples include machine learning, content management, vision, speech, content augmentation, profiling, music retrieval, feature extraction, audio and video fingerprinting, resource management, multimedia servers, network scheduling, and IC design.

Progress in VLSI Design and Test

Progress in VLSI Design and Test Book
Author : Hafizur Rahaman,Sanatan Chattopadhyay,Santanu Chattopadhyay
Publisher : Springer
Release : 2012-06-26
ISBN : 3642314945
Language : En, Es, Fr & De

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Book Description :

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

The Computer Engineering Handbook

The Computer Engineering Handbook Book
Author : Vojin G. Oklobdzija
Publisher : CRC Press
Release : 2001-12-26
ISBN : 1420041541
Language : En, Es, Fr & De

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Book Description :

There is arguably no field in greater need of a comprehensive handbook than computer engineering. The unparalleled rate of technological advancement, the explosion of computer applications, and the now-in-progress migration to a wireless world have made it difficult for engineers to keep up with all the developments in specialties outside their own

3D Integration for NoC based SoC Architectures

3D Integration for NoC based SoC Architectures Book
Author : Abbas Sheibanyrad,Frédéric Pétrot,Axel Jantsch
Publisher : Springer Science & Business Media
Release : 2010-11-08
ISBN : 1441976183
Language : En, Es, Fr & De

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Book Description :

This book presents the research challenges that are due to the introduction of the 3rd dimension in chips for researchers and covers the whole architectural design approach for 3D-SoCs. Nowadays the 3D-Integration technologies, 3D-Design techniques, and 3D-Architectures are emerging as interesting, truly hot, broad topics. The present book gathers the recent advances in the whole domain by renowned experts in the field to build a comprehensive and consistent book around the hot topics of three-dimensional architectures and micro-architectures. This book includes contributions from high level international teams working in this field.