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System on Chip Test Architectures

System on Chip Test Architectures Book
Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
Release : 2010-07-28
ISBN : 9780080556802
Language : En, Es, Fr & De

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Book Description :

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures Book
Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
Publisher : Elsevier
Release : 2006-08-14
ISBN : 9780080474793
Language : En, Es, Fr & De

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Book Description :

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

System on Chip for Real Time Applications

System on Chip for Real Time Applications Book
Author : Wael Badawy,Graham A. Julien
Publisher : Springer Science & Business Media
Release : 2002-10-31
ISBN : 9781402072543
Language : En, Es, Fr & De

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Book Description :

System-on-Chip for Real-Time Applications will be of interest to engineers, both in industry and academia, working in the area of SoC VLSI design and application. It will also be useful to graduate and undergraduate students in electrical and computer engineering and computer science. A selected set of papers from the 2nd International Workshop on Real-Time Applications were used to form the basis of this book. It is organized into the following chapters: -Introduction; -Design Reuse; -Modeling; -Architecture; -Design Techniques; -Memory; -Circuits; -Low Power; -Interconnect and Technology; -MEMS. System-on-Chip for Real-Time Applications contains many signal processing applications and will be of particular interest to those working in that community.

Introduction to Advanced System on Chip Test Design and Optimization

Introduction to Advanced System on Chip Test Design and Optimization Book
Author : Erik Larsson
Publisher : Springer Science & Business Media
Release : 2006-03-30
ISBN : 0387256245
Language : En, Es, Fr & De

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Book Description :

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

ARM System on chip Architecture

ARM System on chip Architecture Book
Author : Stephen Bo Furber
Publisher : Pearson Education
Release : 2000
ISBN : 9780201675191
Language : En, Es, Fr & De

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Book Description :

A reference for system-on-chip designers and professional engineers covers design, memory management, on-chip buses, debug and production tests, application development, and ARM and Thumb programming models.

Design and Test Technology for Dependable Systems on chip

Design and Test Technology for Dependable Systems on chip Book
Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
Publisher : IGI Global
Release : 2011-01-01
ISBN : 1609602145
Language : En, Es, Fr & De

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Book Description :

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

SOC System on a Chip Testing for Plug and Play Test Automation

SOC  System on a Chip  Testing for Plug and Play Test Automation Book
Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
Release : 2013-04-17
ISBN : 1475765274
Language : En, Es, Fr & De

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Book Description :

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

System on a chip

System on a chip Book
Author : Rochit Rajsuman
Publisher : Artech House Publishers
Release : 2000
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Starting with a basic overview of system-on-a-chip (SoC), including definitions of related terms, this new book helps you understand SoC design challenges, and the latest design and test methodologies. You see how ASIC technology evolved to an embedded cores-based concept that includes pre-designed, reusable Intellectual Property (IP) cores that act as microprocessors, data storage devices, DSP, bus control, and interfaces -- all "stitched" together by a User's Defined Logic (UDL).

System on Chip Security

System on Chip Security Book
Author : Farimah Farahmandi,Yuanwen Huang,Prabhat Mishra
Publisher : Springer Nature
Release : 2019-11-22
ISBN : 3030305961
Language : En, Es, Fr & De

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Book Description :

This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.

Principles of Testing Electronic Systems

Principles of Testing Electronic Systems Book
Author : Samiha Mourad,Yervant Zorian
Publisher : John Wiley & Sons
Release : 2000-07-25
ISBN : 9780471319313
Language : En, Es, Fr & De

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Book Description :

A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Digital System Test and Testable Design

Digital System Test and Testable Design Book
Author : Zainalabedin Navabi
Publisher : Springer Science & Business Media
Release : 2010-12-10
ISBN : 9781441975485
Language : En, Es, Fr & De

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Book Description :

This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Network on Chip

Network on Chip Book
Author : Santanu Kundu,Santanu Chattopadhyay
Publisher : CRC Press
Release : 2018-09-03
ISBN : 1466565276
Language : En, Es, Fr & De

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Book Description :

Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and mapping of applications onto NoC. It details the design and evaluation of different proposed NoC structures, low-power techniques, signal integrity and reliability issues, application mapping, testing, and future trends. Utilizing examples of chips that have been implemented in industry and academia, this text presents the full architectural design of components verified through implementation in industrial CAD tools. It describes NoC research and developments, incorporates theoretical proofs strengthening the analysis procedures, and includes algorithms used in NoC design and synthesis. In addition, it considers other upcoming NoC issues, such as low-power NoC design, signal integrity issues, NoC testing, reconfiguration, synthesis, and 3-D NoC design. This text comprises 12 chapters and covers: The evolution of NoC from SoC—its research and developmental challenges NoC protocols, elaborating flow control, available network topologies, routing mechanisms, fault tolerance, quality-of-service support, and the design of network interfaces The router design strategies followed in NoCs The evaluation mechanism of NoC architectures The application mapping strategies followed in NoCs Low-power design techniques specifically followed in NoCs The signal integrity and reliability issues of NoC The details of NoC testing strategies reported so far The problem of synthesizing application-specific NoCs Reconfigurable NoC design issues Direction of future research and development in the field of NoC Network-on-Chip: The Next Generation of System-on-Chip Integration covers the basic topics, technology, and future trends relevant to NoC-based design, and can be used by engineers, students, and researchers and other industry professionals interested in computer architecture, embedded systems, and parallel/distributed systems.

Testing of Digital Systems

Testing of Digital Systems Book
Author : N. K. Jha,S. Gupta
Publisher : Cambridge University Press
Release : 2003-05-08
ISBN : 9781139437431
Language : En, Es, Fr & De

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Book Description :

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Proceedings

Proceedings Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Proceedings book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

System on Chip

System on Chip Book
Author : Bashir M. Al-Hashimi
Publisher : IET
Release : 2006-01-01
ISBN : 0863415520
Language : En, Es, Fr & De

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Book Description :

System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings. The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts in the field. This book covers the general principles of designing, validating and testing complex embedded computing systems and their underlying tradeoffs. The book has twenty five chapters organised into eight parts, each part focuses on a particular topic of SoC. Each chapter has some background covering the basic principles, and extensive list of references. It is aimed at graduate students, designers and managers working in Electronic and Computer engineering.

Asian Test Symposium

Asian Test Symposium Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Asian Test Symposium book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Functional Verification of Programmable Embedded Architectures

Functional Verification of Programmable Embedded Architectures Book
Author : Prabhat Mishra,Nikil D. Dutt
Publisher : Springer Science & Business Media
Release : 2005-07
ISBN : 9780387261430
Language : En, Es, Fr & De

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Book Description :

Validation of programmable architectures, consisting of processor cores, coprocessors, and memory subsystems, is one of the major bottlenecks in current System-on-Chip design methodology. A critical challenge in validation of such systems is the lack of a golden reference model. As a result, many existing validation techniques employ a bottom-up approach to design verification, where the functionality of an existing architecture is, in essence, reverse-engineered from its implementation. Traditional validation techniques employ different reference models depending on the abstraction level and verification task, resulting in potential inconsistencies between multiple reference models. This book presents a top-down validation methodology that complements the existing bottom-up approaches. It leverages the system architect’s knowledge about the behavior of the design through architecture specification using an Architecture Description Language (ADL). The authors also address two fundamental challenges in functional verification: lack of a golden reference model, and lack of a comprehensive functional coverage metric. Functional Verification of Programmable Embedded Architectures: A Top-Down Approach is designed for students, researchers, CAD tool developers, designers, and managers interested in the development of tools, techniques and methodologies for system-level design, microprocessor validation, design space exploration and functional verification of embedded systems.

Program Management for System on Chip Platforms

Program Management for System on Chip Platforms Book
Author : Whitson G. Waldo
Publisher : First Books
Release : 2010-09-01
ISBN : 1592994830
Language : En, Es, Fr & De

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Book Description :

A Fully Integrated Presentation of New Hardware and Software Product Introductions Using Program Management Methodologies for System on Chip Platforms If you're an executive, manager, or engineer in the semiconductor, software, or systems industries, this book provides conceptual views ranging from the design of integrated circuits or systems on a chip, through fabrication, to integration of chips onto boards, and through development of enablement and runtime software for system and platform deliveries. Special features included this book are: - Program management methodologies - General management fundamentals - An overview of leadership principles - Basic discrete device technology - Internal structure and operation of some common logic gates - Basic integrated circuit design concepts, building blocks, and flow - Chip packaging technologies - Details of the fabrication process for integrated circuits - Printed circuit board design, manufacture, and test - Software design, development, and test - Integrated circuit test, silicon validation, and device qualification - Program management applications bringing it all together The book explores interactions and dependencies of technologies that impact systems and platforms. This is a valuable resource to learn these technologies or to use as a reference.

Processor Design

Processor Design Book
Author : Jari Nurmi
Publisher : Springer Science & Business Media
Release : 2007-07-26
ISBN : 1402055307
Language : En, Es, Fr & De

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Book Description :

Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.

Proceedings

Proceedings Book
Author : International Test Conference
Publisher : Unknown
Release : 1995
ISBN : 9780780329928
Language : En, Es, Fr & De

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Book Description :

Download Proceedings book written by International Test Conference, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.