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Reliability Robustness And Failure Mechanisms Of Led Devices

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Reliability Robustness and Failure Mechanisms of LED Devices

Reliability  Robustness and Failure Mechanisms of LED Devices Book
Author : Yannick Deshayes,Laurent Bechou
Publisher : Elsevier
Release : 2017-03-27
ISBN : 0081010885
Language : En, Es, Fr & De

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Book Description :

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Reliability Robustness and Failure Mechanisms of Led Devices

Reliability  Robustness and Failure Mechanisms of Led Devices Book
Author : Yannick Deshayes,Laurent Bchou
Publisher : Iste Press - Elsevier
Release : 2016-10-01
ISBN : 9781785481529
Language : En, Es, Fr & De

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Book Description :

"Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation" presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDsIdentifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applicationsUses a complete methodology to reduce the number of samples needed to estimate lifetime distributionFocuses on the method to extract fundamental parameters from electrical and optical characterizations"

Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications Book
Author : Raphael Baillot,Yannick Deshayes
Publisher : Elsevier
Release : 2017-03-09
ISBN : 0081010923
Language : En, Es, Fr & De

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Book Description :

Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. Based on the work of two main Phd results in 2011 and 2014 Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model Proposes the technology and methodologies to understand failure mechanisms

Nitride Semiconductor Light Emitting Diodes LEDs

Nitride Semiconductor Light Emitting Diodes  LEDs  Book
Author : Jian-Jang Huang,Hao-Chung Kuo,Shyh-Chiang Shen
Publisher : Woodhead Publishing
Release : 2017-10-24
ISBN : 0081019432
Language : En, Es, Fr & De

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Book Description :

Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications, Second Edition reviews the fabrication, performance and applications of the technology, encompassing the state-of-the-art material and device development, along with considerations regarding nitride-based LED design. This updated edition is based on the latest research and advances, including two new chapters on LEDs for large displays and laser lighting. Chapters cover molecular beam epitaxy (MBE) growth of nitride semiconductors, modern metalorganic chemical vapor deposition (MOCVD) techniques, the growth of nitride-based materials, and gallium nitride (GaN)-on-sapphire and GaN-on-silicon technologies for LEDs. Nanostructured, non-polar and semi-polar nitride-based LEDs, as well as phosphor-coated nitride LEDs, are also discussed. The book also addresses the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots. Further chapters discuss the development of LED encapsulation technology and fundamental efficiency droop issues in gallium indium nitride (GaInN) LEDs. It is a technical resource for academics, physicists, materials scientists, electrical engineers, and those working in the lighting, consumer electronics, automotive, aviation, and communications sectors. Features new chapters on laser lighting, addressing the latest advances on this topic Reviews fabrication, performance, and applications of this technology that encompass the state-of-the-art material and device development Covers the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots Highlights applications of nitride LEDs, including liquid crystal display (LCD) backlighting, infra-red emitters, and automotive lighting Provides a comprehensive discussion of gallium nitride on both silicon and sapphire substrates

Proceedings

Proceedings Book
Author : Anonim
Publisher : Unknown
Release : 1998
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Proceedings book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

MEMS Reliability for Critical and Space Applications

MEMS Reliability for Critical and Space Applications Book
Author : Russell A. Lawton
Publisher : Society of Photo Optical
Release : 1999
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

A selection of scientific papers on the reliability of microelectromechanical systems (MEMS) for critical and space applications.

Failure Mechanisms in Semiconductor Devices

Failure Mechanisms in Semiconductor Devices Book
Author : E. Ajith Amerasekera,Farid N. Najm
Publisher : Wiley-Blackwell
Release : 1997-08-04
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.

1999 IEEE International Reliability Physics Symposium Proceedings

1999 IEEE International Reliability Physics Symposium Proceedings Book
Author : International Reliability Physics Symposium
Publisher : Unknown
Release : 1999
ISBN : 9780780352216
Language : En, Es, Fr & De

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Book Description :

Download 1999 IEEE International Reliability Physics Symposium Proceedings book written by International Reliability Physics Symposium, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

1995 IEEE International Reliability Physics Proceedings

1995 IEEE International Reliability Physics Proceedings Book
Author : Anonim
Publisher : Unknown
Release : 1995
ISBN : 9780780320321
Language : En, Es, Fr & De

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Book Description :

Download 1995 IEEE International Reliability Physics Proceedings book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Science Abstracts

Science Abstracts Book
Author : Anonim
Publisher : Unknown
Release : 1995
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Science Abstracts book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Seventeenth IEEE CPMT International Electronics Manufacturing Technology Symposium October 2 4 1995 Austin TX USA

Seventeenth IEEE CPMT International Electronics Manufacturing Technology Symposium  October 2 4  1995  Austin  TX  USA Book
Author : Walt Trybula
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Release : 1995
ISBN : 9780780329973
Language : En, Es, Fr & De

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Book Description :

Download Seventeenth IEEE CPMT International Electronics Manufacturing Technology Symposium October 2 4 1995 Austin TX USA book written by Walt Trybula, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Semiconductor Laser Engineering Reliability and Diagnostics

Semiconductor Laser Engineering  Reliability and Diagnostics Book
Author : Peter W. Epperlein
Publisher : John Wiley & Sons
Release : 2013-01-25
ISBN : 1118481860
Language : En, Es, Fr & De

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Book Description :

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L

Java Jini Technologies

Java Jini Technologies Book
Author : Sudipto Ghosh
Publisher : Society of Photo Optical
Release : 2001
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Java Jini Technologies book written by Sudipto Ghosh, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Compound Semiconductor

Compound Semiconductor Book
Author : Anonim
Publisher : Unknown
Release : 2003
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Compound Semiconductor book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conferences 2005

Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conferences  2005 Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conferences 2005 book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Proceedings

Proceedings Book
Author : International Electronics Manufacturing Technology Symposium (16, 1994, La Jolla, Calif.)
Publisher : Unknown
Release : 1994
ISBN : 9780780320383
Language : En, Es, Fr & De

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Book Description :

Download Proceedings book written by International Electronics Manufacturing Technology Symposium (16, 1994, La Jolla, Calif.), available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Electrical Electronics Abstracts

Electrical   Electronics Abstracts Book
Author : Anonim
Publisher : Unknown
Release : 1997
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Electrical Electronics Abstracts book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Index to IEEE Publications

Index to IEEE Publications Book
Author : Institute of Electrical and Electronics Engineers
Publisher : Unknown
Release : 1997
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Issues for 1973- cover the entire IEEE technical literature.