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Quantitative Data Processing In Scanning Probe Microscopy

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Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy Book
Author : Petr Klapetek
Publisher : Elsevier
Release : 2018-02-03
ISBN : 0128133481
Language : En, Es, Fr & De

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Book Description :

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques

Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy Book
Author : Petr Klapetek
Publisher : William Andrew
Release : 2012-12-31
ISBN : 1455730599
Language : En, Es, Fr & De

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Book Description :

Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings. Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable. Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available).

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy Book
Author : Francesco Marinello,Daniele Passeri,Enrico Savio
Publisher : Springer Science & Business Media
Release : 2012-10-04
ISBN : 3642274935
Language : En, Es, Fr & De

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Book Description :

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Atomic Force Microscopy

Atomic Force Microscopy Book
Author : Bert Voigtländer
Publisher : Springer
Release : 2019-05-23
ISBN : 303013654X
Language : En, Es, Fr & De

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Book Description :

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Nanotechnology Standards

Nanotechnology Standards Book
Author : Vladimir Murashov,John Howard
Publisher : Springer Science & Business Media
Release : 2011-02-01
ISBN : 9781441978530
Language : En, Es, Fr & De

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Book Description :

Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK

Growth and Properties of Ultrathin Epitaxial Layers

Growth and Properties of Ultrathin Epitaxial Layers Book
Author : N.A
Publisher : Elsevier
Release : 1997-06-18
ISBN : 9780080532677
Language : En, Es, Fr & De

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Book Description :

Although there has been steady progress in understanding aspects of epitaxial growth throughout the last 30 years of modern surface science, work in this area has intensified greatly in the last 5 years. A number of factors have contributed to this expansion. One has been the general trend in surface science to tackle problems of increasing complexity as confidence is gained in the methodology, so for example, the role of oxide/metal interfaces in determining the properties of many practical supported catalysts is now being explored in greater detail. A second factor is the recognition of the potential importance of artificial multilayer materials not only in semiconductor devices but also in metal/metal systems because of their novel magnetic properties. Perhaps even more important than either of these application areas, however, is the newly-discovered power of scanning probe microscopies, and most notably scanning tunneling microscopy (STM), to provide the means to study epitaxial growth phenomena on an atomic scale under a wide range of conditions. These techniques have also contributed to revitalised interest in methods of fabricating and exploiting artificial structures (lateral as well as in layers) on a nanometre scale. This volume, on Growth and Properties of Ultrathin Epitaxial Layers, includes a collection of articles which reflects the present state of activity in this field. The emphasis is on metals and oxides rather than semiconductors.

Scanning Probe Microscopy

Scanning Probe Microscopy Book
Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Release : 2007-04-03
ISBN : 0387286683
Language : En, Es, Fr & De

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Book Description :

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy Book
Author : Sascha Sadewasser,Thilo Glatzel
Publisher : Springer
Release : 2018-03-09
ISBN : 3319756877
Language : En, Es, Fr & De

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Book Description :

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI Book
Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Release : 2008-10-22
ISBN : 3540850376
Language : En, Es, Fr & De

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Book Description :

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Scanning Probe Microscopy

Scanning Probe Microscopy Book
Author : Ernst Meyer,Hans J. Hug,Roland Bennewitz
Publisher : Springer Science & Business Media
Release : 2003-08-27
ISBN : 9783540431800
Language : En, Es, Fr & De

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Book Description :

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Microbeam Analysis

Microbeam Analysis Book
Author : John J. Friel
Publisher : Vch Pub
Release : 1994-07
ISBN : 9781560816805
Language : En, Es, Fr & De

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Book Description :

Applied Scanning Probe Methods IX

Applied Scanning Probe Methods IX Book
Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Release : 2007-12-20
ISBN : 354074083X
Language : En, Es, Fr & De

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Book Description :

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

Synthetic Polymeric Membranes

Synthetic Polymeric Membranes Book
Author : K. C. Khulbe,C. Y. Feng,Takeshi Matsuura
Publisher : Springer Science & Business Media
Release : 2007-12-03
ISBN : 9783540739944
Language : En, Es, Fr & De

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Book Description :

Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.

Applied Scanning Probe Methods VIII

Applied Scanning Probe Methods VIII Book
Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Release : 2007-12-20
ISBN : 3540740805
Language : En, Es, Fr & De

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Book Description :

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Physics Briefs

Physics Briefs Book
Author : N.A
Publisher :
Release : 1994
ISBN :
Language : En, Es, Fr & De

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Book Description :

Applied Scanning Probe Methods XIII

Applied Scanning Probe Methods XIII Book
Author : Bharat Bhushan,Harald Fuchs
Publisher : Springer Science & Business Media
Release : 2008-10-29
ISBN : 354085049X
Language : En, Es, Fr & De

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Book Description :

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.