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Microwave De Embedding

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Microwave De embedding

Microwave De embedding Book
Author : Giovanni Crupi,Dominique Schreurs
Publisher : Academic Press
Release : 2013-11-09
ISBN : 0124045928
Language : En, Es, Fr & De

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Book Description :

This groundbreaking book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies. With this book you will learn: The theoretical background of high-frequency de-embedding for measurements, modelling, and design Details on applying the de-embedding concept to the transistor’s linear, non-linear, and noise behaviour The impact of de-embedding on low-noise and power amplifier design The recent advances and future trends in the field of high-frequency de-embedding Presents the theory and practice of microwave de-embedding, from the basic principles to recent advances and future trends Written by experts in the field, all of whom are leading researchers in the area Each chapter describes theoretical background and gives experimental results and practical applications Includes forewords by Giovanni Ghione and Stephen Maas

Microwave De embedding

Microwave De embedding Book
Author : Manuel Yarlequé,Dominique M.M.-P. Schreurs,Bart Nauwelaers,Davide Resca,Giorgio Vannini
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068620
Language : En, Es, Fr & De

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Book Description :

This chapter aims to describe methodologies and techniques for de-embedding device measurements from extrinsic measurements by characterizing the parasitic network surrounding the intrinsic device, through the use of a three-dimensional (3D) physical model of the network and its electromagnetic (EM) analysis. The electromagnetic behavior is obtained employing 3D EM solvers and internal ports. In the first part, the de-embedding processes for field-effect transistor (FET) devices to be used for monolithic microwave integrated circuit designs are studied by four different approaches; in the second part of this chapter, the de-embedding of FET devices for hybrid circuit design purposes is described.

Microwave De embedding

Microwave De embedding Book
Author : Gilles Dambrine
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068566
Language : En, Es, Fr & De

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Book Description :

This chapter aims to describe experimental tools and techniques used for on-wafer millimeter (mm)-wave characterizations of silicon-based devices under the small-signal regime. We discuss the basics of scattering parameters (S parameters), high-frequency (HF) noise concept and measurement facilities, and expert details concerning experimental procedures. In this chapter, we describe first the basic notions of the S-parameters concept and its limitations, as well of as those HF noise. Secondly, the main experimental tools such as mm-wave vectorial network analyzer, noise setup, and on-wafer station are depicted. The third part concerns the description and the methodology of on-wafer calibration and de-embedding techniques applied for mm-wave advanced silicon devices. Finally, the last section focuses on the presentation and description of several examples of device characterizations. The main objective of this chapter is to propose a tradeoff between basic information and details of experience.

Microwave De embedding

Microwave De embedding Book
Author : James C. Rautio
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068582
Language : En, Es, Fr & De

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Book Description :

Just as physical microwave measurements must be de-embedded from test fixtures by means of calibration, electromagnetic analysis must likewise be calibrated so the results may be de-embedded. This chapter investigates the nature of the electromagnetic analysis port discontinuity, how it is characterized by calibration, and how it is removed (including a possible reference plane shift) by de-embedding. Both double-delay and short-open calibration are described. The theory for single port calibration and de-embedding is presented in a manner that is easily extended to treat multiple coupled ports. Additional theory shows how to extend calibration to groups of internal ports, critical, for example, in analyzing the passive planar portion of an amplifier (both the input and output matching networks in the same analysis) and having internal calibrated ports for connecting the transistor. Evaluation of error (accuracy) is covered in detail. Techniques that take advantage of calibrated ports, including circuit subdivision and port tuning, are described.

Microwave De embedding

Microwave De embedding Book
Author : José C. Pedro,Telmo R. Cunha
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068612
Language : En, Es, Fr & De

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Book Description :

This work presents an overview of the various facets of microwave device behavioral modeling technology, from the mathematical formulation to the required laboratory parameter extraction, focusing its attention on one of the less covered aspects: the embedding and de-embedding procedures associated with the behavioral model extraction process. The discussion starts with the revision of some of the most important behavioral modeling tools, explaining the three most important types of behavioral model formats (polynomial, artificial neural networks, and table-based models) and their instantiation in the context of microwave transistors. Then, it will evolve to the behavioral model parameter extraction procedures, reviewing the required specific microwave instrumentation and correspondent calibration and de-embedding of measurement data. Finally, this chapter will illustrate the use of embedding and de-embedding procedures in the behavioral modeling context, giving a particular emphasis on the needed behavioral model inversion techniques.

Microwave De embedding

Microwave De embedding Book
Author : Antonio Raffo,Valeria Vadalà,Giorgio Vannini
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068639
Language : En, Es, Fr & De

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Book Description :

The chapter deals with two recently proposed characterization techniques of microwave transistors oriented to high-frequency power amplifier (PA) design. In particular, the nonlinear embedding and de-embedding design techniques are detailed, along with evidence of their advantages with respect to conventional design approaches in terms of power and frequency handling capability. The discussion also details the differences between the two techniques; despite the fact that they share the same theoretical basis, the techniques suffer from different critical facets. Finally, with the aim of guiding the reader towards full comprehension of the topic, different experimental examples are provided for transistor characterization and PA design.

Microwave De embedding

Microwave De embedding Book
Author : Ernesto Limiti,Walter Ciccognani,Sergio Colangeli
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068574
Language : En, Es, Fr & De

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Book Description :

An overview of topics is presented related to noise characterization and modeling of linear, active devices for microwave applications, as well as to advanced methodologies for low-noise design. A complete description of the most common noise measurement techniques, namely the Y-factor method and the cold source method, are provided, with particular attention being paid to practical aspects such as de-embedding the measurement at the device under test reference planes, possible sources of error, and uncertainty estimation. Noise modeling is approached from a well-established standpoint, based on the extraction of a small-signal equivalent circuit model; but also source pull-based techniques—both standard and advanced ones—are broadly illustrated. Finally, a comprehensive discussion on design of single- and multistage low-noise amplifiers is proposed, ranging from the most classical tools and methodologies, such as constant-gain and constant-noise circles, to novel graphical tools and more advanced concepts, such as global mismatch limits and noise measure.

Microwave De embedding

Microwave De embedding Book
Author : Wendy Van Moer,Lieve Lauwers,Kurt Barbé
Publisher : Elsevier Inc. Chapters
Release : 2013-11-09
ISBN : 0128068604
Language : En, Es, Fr & De

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Book Description :

The world is often considered to behave approximately linearly. However, many real-life phenomena are inherently nonlinear! Hence, in order to accurately model the true behavior of a radio-frequency device or system, its nonlinear characteristics can no longer be ignored and should be taken into account. To do so, one should first be able to measure these nonlinear effects. After some years of hesitation, the high-frequency measurement world finally acknowledged the necessity to accurately measure the in- and out-of-band nonlinear behavior of a radio-frequency (RF) device or system. Since then, different measurement approaches have been developed to achieve this goal. The two major measurement principles being pursued are the sampler-based and the mixer-based methodology. The calibration and de-embedding process of nonlinear measurements is quite involved and requires special calibration standards. From the acquired “nonlinear” measurement data, one can then build a model that accurately describes the in-band and out-of-band nonlinear behavior of an RF system. This chapter will show the reader how to do accurate nonlinear RF measurements and how to obtain a simple and robust characterization of the nonlinear behavior of an RF system.

On Wafer Microwave Measurements and De embedding

On Wafer Microwave Measurements and De embedding Book
Author : Errikos Lourandakis
Publisher : Artech House
Release : 2016-07-31
ISBN : 1630813710
Language : En, Es, Fr & De

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Book Description :

This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.

Microwave De embedding

Microwave De embedding Book
Author : Giovanni Crupi,Dominique Schreurs
Publisher : Unknown
Release : 2013-11-20
ISBN : 9780124017009
Language : En, Es, Fr & De

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Book Description :

This groundbreaking book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies. With this book you will learn: The theoretical background of high-frequency de-embedding for measurements, modelling, and design Details on applying the de-embedding concept to the transistor's linear, non-linear, and noise behaviour The impact of de-embedding on low-noise and power amplifier design The recent advances and future trends in the field of high-frequency de-embedding Presents the theory and practice of microwave de-embedding, from the basic principles to recent advances and future trends Written by experts in the field, all of whom are leading researchers in the area Each chapter describes theoretical background and gives experimental results and practical applications Includes forewords by Giovanni Ghione and Stephen Maas

Microwave Systems and Applications

Microwave Systems and Applications Book
Author : Sotirios Goudos
Publisher : BoD – Books on Demand
Release : 2017-01-11
ISBN : 9535128671
Language : En, Es, Fr & De

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Book Description :

Microwave systems are key components of every modern wireless communication system. The main objective of this book was to collect as many different state-of-the-art studies as possible in order to cover in a single volume the main aspects of microwave systems and applications. This book contains 17 chapters written by acknowledged experts, researchers, academics, and microwave engineers, providing comprehensive information and covering a wide range of topics on all aspects of microwave systems and applications. This book is divided into four parts. The first part is devoted to microwave components. The second part deals with microwave ICs and innovative techniques for on-chip antenna design. The third part presents antenna design cases for microwave systems. Finally, the last part covers different applications of microwave systems.

Handbook of Microwave Component Measurements

Handbook of Microwave Component Measurements Book
Author : Joel P. Dunsmore
Publisher : John Wiley & Sons
Release : 2020-06-29
ISBN : 1119477131
Language : En, Es, Fr & De

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Book Description :

Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.

Microwave Circuit Modeling Using Electromagnetic Field Simulation

Microwave Circuit Modeling Using Electromagnetic Field Simulation Book
Author : Daniel G. Swanson,Wolfgang J. R. Hoefer
Publisher : Artech House
Release : 2003
ISBN : 9781580536882
Language : En, Es, Fr & De

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Book Description :

Annotation This practical "how to" book is an ideal introduction to electromagnetic field-solvers. Where most books in this area are strictly theoretical, this unique resource provides engineers with helpful advice on selecting the right tools for their RF (radio frequency) and high-speed digital circuit design work

Practical RF Circuit Design for Modern Wireless Systems

Practical RF Circuit Design for Modern Wireless Systems Book
Author : Les Besser,Rowan Gilmore
Publisher : Artech House
Release : 2002-12-31
ISBN : 9781580536752
Language : En, Es, Fr & De

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Book Description :

Annotation In today's globally competitive wireless industry, the design-to-production cycle is critically important. The first of a two-volume set, this leading-edge book takes a practical approach to RF (radio frequency) circuit design, offering a complete understanding of the fundamental concepts practitioners need to know and use for their work in the field.

Issues in Electronics Research and Application 2011 Edition

Issues in Electronics Research and Application  2011 Edition Book
Author : Anonim
Publisher : ScholarlyEditions
Release : 2012-01-09
ISBN : 1464963916
Language : En, Es, Fr & De

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Book Description :

Issues in Electronics Research and Application: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Electronics Research and Application. The editors have built Issues in Electronics Research and Application: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Electronics Research and Application in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Electronics Research and Application: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

S Parameters for Signal Integrity

S Parameters for Signal Integrity Book
Author : Peter J. Pupalaikis
Publisher : Cambridge University Press
Release : 2020-02-06
ISBN : 1108489966
Language : En, Es, Fr & De

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Book Description :

A practical guide to solving signal integrity problems using s-parameters.

Numerical Simulation

Numerical Simulation Book
Author : Mykhaylo Andriychuk
Publisher : BoD – Books on Demand
Release : 2012-09-19
ISBN : 9535107496
Language : En, Es, Fr & De

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Book Description :

Numerical Simulation - from Theory to Industry is the edited book containing 25 chapters and divided into four parts. Part 1 is devoted to the background and novel advances of numerical simulation; second part contains simulation applications in the macro- and micro-electrodynamics. Part 3 includes contributions related to fluid dynamics in the natural environment and scientific applications; the last, fourth part is dedicated to simulation in the industrial areas, such as power engineering, metallurgy and building. Recent numerical techniques, as well as software the most accurate and advanced in treating the physical phenomena, are applied in order to explain the investigated processes in terms of numbers. Since the numerical simulation plays a key role in both theoretical and industrial research, this book related to simulation of many physical processes, will be useful for the pure research scientists, applied mathematicians, industrial engineers, and post-graduate students.

RF Measurements of Die and Packages

RF Measurements of Die and Packages Book
Author : Scott A. Wartenberg
Publisher : Artech House
Release : 2002
ISBN : 9781580532730
Language : En, Es, Fr & De

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Book Description :

The recent explosion of the RF wireless integrated circuits (IC), coupled with higher operating speeds in digital IC's has made accurate RF testing of IC's vital. This ground-breaking resource explains the fundamentals of performing accurate RF measurements of die and packages. It offers you practical advice on how to use coplanar probes and test fixtures in the lab for RF on-wafer die and package characterization. It also details how to build separate RF test systems for noise, high-power, and thermal testing as well as de-embed the test system's parasitic effects to get the die's RF performance. This book is a handy, practical resource for RFIC and MMIC designers as well as high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.

Microwave Wireless Communications

Microwave Wireless Communications Book
Author : Antonio Raffo,Giovanni Crupi
Publisher : Academic Press
Release : 2016-03-01
ISBN : 0128039361
Language : En, Es, Fr & De

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Book Description :

To design and develop fast and effective microwave wireless systems today involves addressing the three different ‘levels’: Device, circuit, and system. This book presents the links and interactions between the three different levels rather than providing just a comprehensive coverage of one specific level. With the aim of overcoming the sectional knowledge of microwave engineers, this will be the first book focused on explaining how the three different levels interact by taking the reader on a journey through the different levels going from the theoretical background to the practical applications. Explains the links and interactions between the three different design levels of wireless communication transmitters: device, circuit, and system Presents state-of-the-art, challenges, and future trends in the field of wireless communication systems Covers all aspects of both mature and cutting-edge technologies for semiconductor devices for wireless communication applications Many circuit designs outlining the limitations derived from the available transistor technologies and system requirements Explains how new microwave measurement techniques can represent an essential tool for microwave modellers and designers

Silicon Germanium and Their Alloys

Silicon  Germanium  and Their Alloys Book
Author : Gudrun Kissinger,Sergio Pizzini
Publisher : CRC Press
Release : 2014-12-09
ISBN : 1466586648
Language : En, Es, Fr & De

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Book Description :

Despite the vast knowledge accumulated on silicon, germanium, and their alloys, these materials still demand research, eminently in view of the improvement of knowledge on silicon–germanium alloys and the potentialities of silicon as a substrate for high-efficiency solar cells and for compound semiconductors and the ongoing development of nanodevices based on nanowires and nanodots. Silicon, Germanium, and Their Alloys: Growth, Defects, Impurities, and Nanocrystals covers the entire spectrum of R&D activities in silicon, germanium, and their alloys, presenting the latest achievements in the field of crystal growth, point defects, extended defects, and impurities of silicon and germanium nanocrystals. World-recognized experts are the authors of the book’s chapters, which span bulk, thin film, and nanostructured materials growth and characterization problems, theoretical modeling, crystal defects, diffusion, and issues of key applicative value, including chemical etching as a defect delineation technique, the spectroscopic analysis of impurities, and the use of devices as tools for the measurement of materials quality.