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Low Power Design Of Nanometer Fpgas

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Low Power Design of Nanometer FPGAs

Low Power Design of Nanometer FPGAs Book
Author : Hassan Hassan,Mohab Anis
Publisher : Morgan Kaufmann
Release : 2009-09-14
ISBN : 0080922341
Language : En, Es, Fr & De

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Book Description :

Low-Power Design of Nanometer FPGAs Architecture and EDA is an invaluable reference for researchers and practicing engineers concerned with power-efficient, FPGA design. State-of-the-art power reduction techniques for FPGAs will be described and compared. These techniques can be applied at the circuit, architecture, and electronic design automation levels to describe both the dynamic and leakage power sources and enable strategies for codesign. Low-power techniques presented at key FPGA design levels for circuits, architectures, and electronic design automation, form critical, "bridge" guidelines for codesign Comprehensive review of leakage-tolerant techniques empowers designers to minimize power dissipation Provides valuable tools for estimating power efficiency/savings of current, low-power FPGA design techniques

Low Power Variation Tolerant Design in Nanometer Silicon

Low Power Variation Tolerant Design in Nanometer Silicon Book
Author : Swarup Bhunia,Saibal Mukhopadhyay
Publisher : Springer Science & Business Media
Release : 2010-11-10
ISBN : 9781441974181
Language : En, Es, Fr & De

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Book Description :

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

EDN

EDN Book
Author : Anonim
Publisher : Unknown
Release : 2009
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Electronic Design

Electronic Design Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Design Methodologies and CAD Tools for Leakage Power Optimization in FPGAs

Design Methodologies and CAD Tools for Leakage Power Optimization in FPGAs Book
Author : Hassan Hassan
Publisher : Unknown
Release : 2008
ISBN : 9780494433836
Language : En, Es, Fr & De

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Book Description :

The scaling of the CMOS technology has precipitated an exponential increase in both subthreshold and gate leakage currents in modern VLSI designs. Consequently, the contribution of leakage power to the total chip power dissipation for CMOS designs is increasing rapidly, which is estimated to be 40% for the current technology generations and is expected to exceed 50% by the 65nm CMOS technology. In FPGAs, the power dissipation problem is further aggravated when compared to ASIC designs because FPGA use more transistors per logic function when compared to ASIC designs. Consequently, solving the leakage power problem is pivotal to devising power-aware FPGAs in the nanometer regime. This thesis focuses on devising both architectural and CAD techniques for leakage mitigation in FPGAs. Several CAD and architectural modifications are proposed to reduce the impact of leakage power dissipation on modern FPGAs. Firstly, multi-threshold CMOS (MTCMOS) techniques are introduced to FPGAs to permanently turn OFF the unused resources of the FPGA, FPGAs are characterized with low utilization percentages that can reach 60%. Moreover, such architecture enables the dynamic shutting down of the FPGA idle parts, thus reducing the standby leakage significantly. Employing the MTCMOS technique in FPGAs requires several changes to the FPGA architecture, including the placement and routing of the sleep signals and the MTCMOS granularity. On the CAD level, the packing and placement stages are modified to allow the possibility of dynamically turning OFF the idle parts of the FPGA. A new activity generation algorithm is proposed and implemented that aims to identify the logic blocks in a design that exhibit similar idleness periods. Several criteria for the activity generation algorithm are used, including connectivity and logic function. Several versions of the activity generation algorithm are implemented to trade power savings with runtime. A newly developed packing algorithm uses the resulting activities to minimize leakage power dissipation by packing the logic blocks with similar or close activities together. By proposing an FPGA architecture that supports MTCMOS and developing a CAD tool that supports the new architecture, an average power savings of 30% is achieved for a 90nm CMOS process while incurring a speed penalty of less than 5%. This technique is further extended to provide a timing-sensitive version of the CAD flow to vary the speed penalty according to the criticality of each logic block. Secondly, a new technique for leakage power reduction in FPGAs based on the use of input dependency is developed. Both subthreshold and gate leakage power are heavily dependent on the input state. In FPGAs, the effect of input dependency is exacerbated due to the use of pass-transistor multiplexer logic, which can exhibit up to 50% variation in leakage power due to the input states. In this thesis, a new algorithm is proposed that uses bit permutation to reduce subthreshold and gate leakage power dissipation in FPGAs. The bit permutation algorithm provides an average leakage power reduction of 40% while having less than 2% impact on the performance and no penalty on the design area. Thirdly, an accurate probabilistic power model for FPGAs is developed to quantify the savings from the proposed leakage power reduction techniques. The proposed power model accounts for dynamic, short circuit, and leakage power (including both subthreshold and gate leakage power) dissipation in FPGAs. Moreover, the power model accounts for power due to glitches, which accounts for almost 20% of the dynamic power dissipation in FPGAs. The use of probabilities in the power model makes it more computationally efficient than the other FPGA power models in the literature that rely on long input sequence simulations. One of the main advantages of the proposed power model is the incorporation of spatial correlation while estimating the signal probability. Other probabilistic FPGA power models assume spatial independence among the design signals, thus overestimating the power calculations. In the proposed model, a probabilistic model is proposed for spatial correlations among the design signals. Moreover, a different variation is proposed that manages to capture most of the spatial correlations with minimum impact on runtime. Furthermore, the proposed power model accounts for the input dependency of subthreshold and gate leakage power dissipation. By comparing the proposed power model to HSpice simulation, the estimated power is within 8% and is closer to HSpice simulations than other probabilistic FPGA power models by an average of 20%.

GLSVLSI 05

GLSVLSI  05 Book
Author : ACM Special Interest Group on Design Automation
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Proceedings of the ACM Great Lakes Symposium on VLSI

Proceedings of the     ACM Great Lakes Symposium on VLSI  Book
Author : Anonim
Publisher : Unknown
Release : 2006
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Standard Poor s Stock Reports

Standard   Poor s Stock Reports Book
Author : Anonim
Publisher : Unknown
Release : 2010-03
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Micropower Digital Design Techniques for the Nanometer Realm

Micropower Digital Design Techniques for the Nanometer Realm Book
Author : Robert Matthew Senger
Publisher : Unknown
Release : 2008
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Micropower Digital Design Techniques for the Nanometer Realm book written by Robert Matthew Senger, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

CERN

CERN  Book
Author : Anonim
Publisher : Unknown
Release : 2007
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Routing Issues in Nanometer scale Integrated Circuits

Routing Issues in Nanometer scale Integrated Circuits Book
Author : Tianpei Zhang
Publisher : Unknown
Release : 2006
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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EDN Electrical Design News

EDN  Electrical Design News Book
Author : Anonim
Publisher : Unknown
Release : 2007
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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FPGA

FPGA     Book
Author : Anonim
Publisher : Unknown
Release : 2006
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Portable Design

Portable Design Book
Author : Anonim
Publisher : Unknown
Release : 2003
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Electronic Engineering Design

Electronic Engineering Design Book
Author : Anonim
Publisher : Unknown
Release : 2002
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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Standard Poor s 500 Guide

Standard   Poor s 500 Guide Book
Author : Standard,Standard and Poor's Corporation,Poor
Publisher : McGraw-Hill Companies
Release : 2004-12
ISBN : 9780071457491
Language : En, Es, Fr & De

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Book Description :

Provides information on activity, recent developments, sales history, earnings, dividends, share prices, and rankings for five hundred top corporations

Dissertation Abstracts International

Dissertation Abstracts International Book
Author : Anonim
Publisher : Unknown
Release : 2008
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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System on Chip Test Architectures

System on Chip Test Architectures Book
Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher : Morgan Kaufmann
Release : 2010-07-28
ISBN : 9780080556802
Language : En, Es, Fr & De

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Book Description :

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Nanometer CMOS ICs

Nanometer CMOS ICs Book
Author : Harry J.M. Veendrick
Publisher : Springer
Release : 2017-04-28
ISBN : 3319475975
Language : En, Es, Fr & De

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Book Description :

This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.