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Internal Photoemission Spectroscopy

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Internal Photoemission Spectroscopy

Internal Photoemission Spectroscopy Book
Author : Valeri V. Afanas'ev
Publisher : Elsevier
Release : 2010-07-07
ISBN : 9780080555898
Language : En, Es, Fr & De

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Book Description :

The monographic book addresses the basics of the charge carrier photoemission from one solid to another - the internal photoemission, (IPE) - and different spectroscopic applications of this phenomenon to solid state heterojunctions. This is the first book in the field of IPE, which complements the conventional external photoemission spectroscopy by analysing interfaces separated from the sample surface by a layer of a different solid or liquid. IPE is providing the most straightforward and, therefore, reliable information regarding the energy spectrum of electron states at interfaces. At the same time, the method provides the unique capability of analysing the heterostructures relevant to the modern micro- and nano-electronic devices as well as new materials involved in their design and fabrication. In addition to the discussion of fundamental physical and technical aspects of IPE spectroscopic applications, several “hot topics are addressed. These include development of new insulating materials for advances Si MOS technology (both high-k gate insulators and low-k dielectrics for interconnect insulation), metal gate materials, development of heterostructures based on high-mobility semiconductors, etc. Thanks to a considerable activity in this field over the last few years, the recent results concerning band structure of most important interfaces involving novel materials can now be documented. - First complete description of the internal photoemission phenomena - A practical guide to internal photoemission measurements - Describes reliable energy barrier determination procedures - Surveys trap spectroscopy methods applicable to thin insulating layers - Provides an overview of the most recent results on band structure of high-permittivity insulating materials and their interfaces - Contains a complete collection of reference data on interface band alignment for wide-bandgap insulating materials in contact with metals and semiconductors

Internal Photoemission Spectroscopy

Internal Photoemission Spectroscopy Book
Author : V. V. Afanasʹev
Publisher : Elsevier Science Limited
Release : 2008
ISBN : 9780080451459
Language : En, Es, Fr & De

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Book Description :

The monographic book addresses the basics of the charge carrier photoemission from one solid to another - the internal photoemission, (IPE) - and different spectroscopic applications of this phenomenon to solid state heterojunctions. This is the first book in the field of IPE, which complements the conventional external photoemission spectroscopy by analysing interfaces separated from the sample surface by a layer of a different solid or liquid. IPE is providing the most straightforward and, therefore, reliable information regarding the energy spectrum of electron states at interfaces. At the same time, the method provides the unique capability of analysing the heterostructures relevant to the modern micro- and nano-electronic devices as well as new materials involved in their design and fabrication. In addition to the discussion of fundamental physical and technical aspects of IPE spectroscopic applications, several "hot" topics are addressed. These include development of new insulating materials for advances Si MOS technology (both high-k gate insulators and low-k dielectrics for interconnect insulation), metal gate materials, development of heterostructures based on high-mobility semiconductors, etc. Thanks to a considerable activity in this field over the last few years, the recent results concerning band structure of most important interfaces involving novel materials can now be documented. - First complete description of the internal photoemission phenomena - A practical guide to internal photoemission measurements - Describes reliable energy barrier determination procedures - Surveys trap spectroscopy methods applicable to thin insulating layers - Provides an overview of the most recent results on band structure of high-permittivity insulating materials and their interfaces - Contains a complete collection of reference data on interface band alignment for wide-bandgap insulating materials in contact with metals and semiconductors

Advanced Gate Stacks for High Mobility Semiconductors

Advanced Gate Stacks for High Mobility Semiconductors Book
Author : Athanasios Dimoulas,Evgeni Gusev,Paul C. McIntyre,Marc Heyns
Publisher : Springer Science & Business Media
Release : 2008-01-01
ISBN : 9783540714910
Language : En, Es, Fr & De

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Book Description :

This book provides a comprehensive monograph on gate stacks in semiconductor technology. It covers the major latest developments and basics and will be useful as a reference work for researchers, engineers and graduate students alike. The reader will get a clear view of what has been done so far, what is the state-of-the-art and which are the main challenges ahead before we come any closer to a viable Ge and III-V MOS technology.

Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics Book
Author : Zhiyong Ma,David G. Seiler
Publisher : CRC Press
Release : 2017-03-27
ISBN : 135173394X
Language : En, Es, Fr & De

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Book Description :

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Hard X ray Photoelectron Spectroscopy HAXPES

Hard X ray Photoelectron Spectroscopy  HAXPES  Book
Author : Joseph Woicik
Publisher : Springer
Release : 2015-12-26
ISBN : 3319240439
Language : En, Es, Fr & De

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Book Description :

This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.

Electronic Properties of Semiconductor Interfaces

Electronic Properties of Semiconductor Interfaces Book
Author : Winfried Mönch
Publisher : Springer Science & Business Media
Release : 2013-04-17
ISBN : 3662069458
Language : En, Es, Fr & De

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Book Description :

Using the continuum of interface-induced gap states (IFIGS) as a unifying theme, Mönch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-function tails of electron states, which overlap a semiconductor band-gap exactly at the interface, so they originate from the quantum-mechanical tunnel effect. He shows that a more chemical view relates the IFIGS to the partial ionic character of the covalent interface-bonds and that the charge transfer across the interface may be modeled by generalizing Pauling?s electronegativity concept. The IFIGS-and-electronegativity theory is used to quantitatively explain the barrier heights and band offsets of well-characterized Schottky contacts and semiconductor heterostructures, respectively.

Transparent Conductive Zinc Oxide

Transparent Conductive Zinc Oxide Book
Author : Klaus Ellmer,Andreas Klein,Bernd Rech
Publisher : Springer Science & Business Media
Release : 2007-12-29
ISBN : 9783540736127
Language : En, Es, Fr & De

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Book Description :

Zinc oxide (ZnO) belongs to the class of transparent conducting oxides that can be used as transparent electrodes in electronic devices or heated windows. In this book the material properties of, the deposition technologies for, and applications of zinc oxide in thin film solar cells are described in a comprehensive manner. Structural, morphological, optical and electronic properties of ZnO are treated in this review.

Photoelectron Spectroscopy

Photoelectron Spectroscopy Book
Author : J. H. D. Eland
Publisher : Elsevier
Release : 2013-10-22
ISBN : 1483103218
Language : En, Es, Fr & De

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Book Description :

Photoelectron Spectroscopy: An Introduction to Ultraviolet Photoelectronspectroscopy in the Gas Phase, Second Edition Photoelectron Spectroscopy: An Introduction to Ultraviolet PhotoelectronSpectroscopy in the Gas Phase, Second Edition aims to give practical approach on the subject of photoelectron spectroscopy, as well as provide knowledge on the interpretation of the photoelectron spectrum. The book covers topics such as the principles and literature of photoelectron microscopy; the main features and analysis of photoelectron spectra; ionization techniques; and energies from the photoelectron spectra. Also covered in the book are topics suc as photoelectron band structure and the applications of photoelectron spectroscopy in chemistry. The text is recommended for students and practitioners of chemistry who would like to be familiarized with the concepts of photoelectron spectroscopy and its importance in the field.

Dielectrics for Nanosystems 3 Materials Science Processing Reliability and Manufacturing

Dielectrics for Nanosystems 3  Materials Science  Processing  Reliability  and Manufacturing Book
Author : D. Misra
Publisher : The Electrochemical Society
Release : 2008-01-01
ISBN : 1566776279
Language : En, Es, Fr & De

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Book Description :

This issue covers papers relating to advanced semiconductor products that are true representatives of nanoelectronics have reached below 100 nm. Depending on the application, the nanosystem may consist of one or more of the following types of functional components: electronic, optical, magnetic, mechanical, biological, chemical, energy sources, and various types of sensing devices. As long as one or more of these functional devices is in 1-100 nm dimensions, the resultant system can be defined as nanosystem. Papers will be in all areas of dielectric issues in nanosystems. In addition to traditional areas of semiconductor processing and packaging of nanoelectronics, emphasis will be placed on areas where multifunctional device integration (through innovation in design, materials, and processing at the device and system levels) will lead to new applications of nanosystems.

Defects in Optoelectronic Materials

Defects in Optoelectronic Materials Book
Author : Kazumi Wada
Publisher : CRC Press
Release : 2001-11-06
ISBN : 9789056997144
Language : En, Es, Fr & De

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Book Description :

Defects in Optoelectronic Materials bridges the gap between device process engineers and defect physicists by describing current problems in device processing and current understanding of these defects based on defect physics. The volume covers defects and their behaviors in epitaxial growth, in various processes such as plasma processing, deposition and implantation, and in device degradation. This book also provides graduate students cutting-edge information on devices and materials interaction.

JJAP

JJAP Book
Author : N.A
Publisher :
Release : 2008
ISBN :
Language : En, Es, Fr & De

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Book Description :

Characterization in Compound Semiconductor Processing

Characterization in Compound Semiconductor Processing Book
Author : Yale Strausser
Publisher :
Release : 1995
ISBN :
Language : En, Es, Fr & De

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Book Description :

The book will have two major sections, one on Si based systems and the other on compound semiconductor systems. Although there are many materials common to both technologies, the applications, processing, and problems seen, are different enough to warrant this separation. In the silicon section there will be a chapter on semiconducting layers, such as epi SI, SOI layers, Si Ge films, etc., discussing the techniques used in problem-solving in these films. In the area of conducting films there will be chapters of doped poly Si, silicides and polycides, Al- and/or Cu-cased films, W-based films and one on barrier materials. Each of these systems is sufficiently different to benefit from a different author and a separate discussion of the types of problems encountered. This section will then be completed by a chapter or dielectric films. Even though there are a number of different applications for dielectrics, i.e. passivation films, intermetal dielectrics, gate oxides, field oxides, ad

Handbook of Spectroscopy

Handbook of Spectroscopy Book
Author : G¿nter Gauglitz,David S. Moore
Publisher : John Wiley & Sons
Release : 2014-05-05
ISBN : 3527654720
Language : En, Es, Fr & De

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Book Description :

This second, thoroughly revised, updated and enlarged edition provides a straightforward introduction to spectroscopy, showing what it can do and how it does it, together with a clear, integrated and objective account of the wealth of information that may be derived from spectra. It also features new chapters on spectroscopy in nano-dimensions, nano-optics, and polymer analysis. Clearly structured into sixteen sections, it covers everything from spectroscopy in nanodimensions to medicinal applications, spanning a wide range of the electromagnetic spectrum and the physical processes involved, from nuclear phenomena to molecular rotation processes. In addition, data tables provide a comparison of different methods in a standardized form, allowing readers to save valuable time in the decision process by avoiding wrong turns, and also help in selecting the instrumentation and performing the experiments. These four volumes are a must-have companion for daily use in every lab.

Physics Briefs

Physics Briefs Book
Author : N.A
Publisher :
Release : 1993
ISBN :
Language : En, Es, Fr & De

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Book Description :

Dielectric Films for Advanced Microelectronics

Dielectric Films for Advanced Microelectronics Book
Author : Mikhail Baklanov,Martin Green,Karen Maex
Publisher : John Wiley & Sons Incorporated
Release : 2007-03-19
ISBN :
Language : En, Es, Fr & De

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Book Description :

The topic of thin films is an area of increasing importance in materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are a few examples of the miniaturized device technologies that depend on the utilization of thin film materials. This book presents an in-depth overview of the novel developments made by the scientific leaders in the area of modern dielectric films for advanced microelectronic applications. It contains clear, concise explanations of material science of dielectric films and their problem for device operation, including high-k, low-k, medium-k dielectric films and also specific features and requirements for dielectric films used in the packaging technology. A broad range of related topics are covered, from physical principles to design, fabrication, characterization, and applications of novel dielectric films.