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Chemical Analysis And Material Characterization By Spectrophotometry

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Chemical Analysis and Material Characterization by Spectrophotometry

Chemical Analysis and Material Characterization by Spectrophotometry Book
Author : Bhim Prasad Kaflé
Publisher : Elsevier
Release : 2019-11-29
ISBN : 0128148675
Language : En, Es, Fr & De

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Book Description :

Chemical Analysis and Material Characterization by Spectrophotometry integrates and presents the latest known information and examples from the most up-to-date literature on the use of this method for chemical analysis or materials characterization. Accessible to various levels of expertise, everyone from students, to practicing analytical and industrial chemists, the book covers both the fundamentals of spectrophotometry and instrumental procedures for quantitative analysis with spectrophotometric techniques. It contains a wealth of examples and focuses on the latest research, such as the investigation of optical properties of nanomaterials and thin solid films. Covers the basic analytical theory that is essential for understanding spectrophotometry Emphasizes minor/trace chemical component analysis Includes the spectrophotometric analysis of nanomaterials and thin solid films Thoroughly describes methods and uses easy-to-follow, practical examples and experiments

A Guide to Materials Characterization and Chemical Analysis

A Guide to Materials Characterization and Chemical Analysis Book
Author : John P. Sibilia
Publisher : John Wiley & Sons
Release : 1988-09-26
ISBN : 9780471186335
Language : En, Es, Fr & De

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Book Description :

Written both for the novice and for the experienced scientist, this miniature encyclopedia concisely describes over one hundred materials methodologies, including evaluation, chemical analysis, and physical testing techniques. Each technique is presented in terms of its use, sample requirements, and the engineering principles behind its methodology. Real life industrial and academic applications are also described to give the reader an understanding of the significance and utilization of technique. There is also a discussion of the limitations of each technique.

Materials Characterization Techniques

Materials Characterization Techniques Book
Author : Sam Zhang,Lin Li,Ashok Kumar
Publisher : CRC Press
Release : 2008-12-22
ISBN : 1420042955
Language : En, Es, Fr & De

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Book Description :

Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This useful volume: Explores scientific processes to characterize materials using modern technologies Provides analysis of materials’ performance under specific use conditions Focuses on the interrelationships and interdependence between processing, structure, properties, and performance Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography Presents the fundamentals of vacuum, as well as X-ray diffraction principles Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.

Laser Spectroscopy for Material Characterization

Laser Spectroscopy for Material Characterization Book
Author : Krishna Kanth Ayyalasomayajula
Publisher : Unknown
Release : 2014
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Laser-Induced Breakdown Spectroscopy (LIBS) is a powerful tool for performing chemical analysis measurements of materials, such as slurries, soils, plastics and powder samples. The LIBS technique has proven to be sensitive, selective and robust for rapid, in situ analysis. The focus of this dissertation is the optimization of laser spectroscopic sensing methodologies for material characterization. The applications of the LIBS technique to slurry samples is very challenging due to the water content (~80%). A new sample preparation method called "spin-on-glass" was adopted to reduce the water content in slurry samples and improve the LIBS signal. The feasibility of using the new sampling method with a LIBS system was tested by applying multivariate analysis to the LIBS spectral data. The calibration results demonstrated that the LIBS technique with the new sampling method could successfully predict the elemental concentrations of slurry samples qualitatively and quantitatively. The possibility of developing a LIBS-based sensor system for total carbon quantification in soil samples was studied. The soil samples were studied in pellet form and the calibration models were developed by using simple linear regression (SLR) and multiple linear regression (MLR) analysis. It was found that both SLR- and MLR-based calibrations successfully predicted the carbon concentration in an unknown sample with relative accuracy (RA) within 8%. The LIBS experimental setup was designed, developed and tested for the determination of elemental impurities in plastic calibration standards that are used in dual-energy computed tomography (CT) scanning for petrophysical applications. Univariate calibration (UC) and multiple linear regression (MLR) analysis were used to develop calibration models. From this study, it was concluded that MLR improved the calibration results and data derived from the LIBS analysis enhanced the predictive capabilities of dual-energy CT scanning in general. A comparative study was performed for quantification of strontium (Sr) in an aluminum (Al) batch with both the atomic and molecular LIBS emissions. The calibration models were developed using SLR analysis and the limits of detection (LOD) were obtained. The study confirmed that molecular LIBS could be used for quantification of Sr in a binary mixture.

Handbook of Materials Characterization

Handbook of Materials Characterization Book
Author : Surender Kumar Sharma
Publisher : Springer
Release : 2018-09-18
ISBN : 3319929550
Language : En, Es, Fr & De

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Book Description :

This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Materials Characterization

Materials Characterization Book
Author : Yang Leng
Publisher : John Wiley & Sons
Release : 2013-08-07
ISBN : 3527670793
Language : En, Es, Fr & De

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Book Description :

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

Surface Chemical Analysis Characterization of Nanostructured Materials

Surface Chemical Analysis  Characterization of Nanostructured Materials Book
Author : British Standards Institute Staff
Publisher : Unknown
Release : 1911-08-31
ISBN : 9780580683985
Language : En, Es, Fr & De

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Book Description :

Surface chemistry, Chemical analysis and testing, Surfaces, Nanomaterials, Nanoparticles, Nanotechnology, Films (states of matter), Spectroscopy, Auger electron spectroscopy, Photoelectron spectroscopy, X-ray photoelectron spectroscopy, Mass spectrometry, Microscopic analysis

Spectroscopy for Materials Characterization

Spectroscopy for Materials Characterization Book
Author : Simonpietro Agnello
Publisher : John Wiley & Sons
Release : 2021-09-28
ISBN : 1119697328
Language : En, Es, Fr & De

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Book Description :

SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.

A Guide to Materials Characterization and Chemical Analysis

A Guide to Materials Characterization and Chemical Analysis Book
Author : John P. Sibilia
Publisher : Wiley-VCH
Release : 1988
ISBN : 9780895732699
Language : En, Es, Fr & De

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Book Description :

Download A Guide to Materials Characterization and Chemical Analysis book written by John P. Sibilia, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Raman Spectroscopy

Raman Spectroscopy Book
Author : Gunter Hoffman
Publisher : Momentum Press
Release : 2019-01-16
ISBN : 9781945612008
Language : En, Es, Fr & De

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Book Description :

The book provides an up-to-date overview of the fast growing area of Raman spectroscopy. The two-volume work describes how analytic methods using Raman spectroscopy allow for the chemical analysis of materials, providing even spatial resolution without precedent. In addition, external perturbations (strain, temperature, pressure) on molecules and their alignment can be analyzed. Raman spectroscopy can also provide information about the interactions of components, again at a high level of spatial resolution. In the form of tip-enhanced Raman spectroscopy (TERS), the method is a valuable tool for nanotechnology. This book is intended for researchers or lecturers in chemistry and materials science, who are interested in the composition and properties of their samples. It describes how Raman spectroscopy will enable them to examine thin layers, surfaces, and interfaces and improve their knowledge about the properties of composites. In addition, it can serve as a short introduction to vibrational spectroscopy.

Practical Materials Characterization

Practical Materials Characterization Book
Author : Mauro Sardela
Publisher : Springer
Release : 2014-07-10
ISBN : 1461492815
Language : En, Es, Fr & De

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Book Description :

Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Advances in Materials Characterization

Advances in Materials Characterization Book
Author : David R. Rossington,Robert A. Condrate,Robert L. Snyder
Publisher : Springer Science & Business Media
Release : 2012-12-06
ISBN : 146158339X
Language : En, Es, Fr & De

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Book Description :

The characterization of materials and phenomena has historically been the principal limitation to the development in each area of science. Once what we are observing is well defined, a theoretical analysis rapidly follows. Modern theories of chemical bonding did not evolve until the methods of analytical chemistry had progressed to a point where the bulk stoichiometry of chemical compounds was firmly established. The great progress made during this century in understanding chemistry has followed directly from the development of an analytical chemistry based on the Dalton assumption of multiple proportions. It has only become apparent in recent years that the extension of our understanding of materials hinges on their non-stoichiometric nature. The world of non-Daltonian chemistry is very poorly understood at present because of our lack of ability to precisely characterize it. The emergence of materials science has only just occurred with our recognition of effects, which have been thought previously to be minor variations from ideality, as the principal phenomena controlling properties. The next step in the historical evolution of materials science must be the development of tools to characterize the often subtle phenomena which determine properties of materials. The various discussions of instrumental techniques presented in this book are excellent summaries for the state-of-the-art of materials characterization at this rather critical stage of materials science. The application of the tools described here, and those yet to be developed, holds the key to the development of this infant into a mature science.

Encyclopedia of Materials Characterization

Encyclopedia of Materials Characterization Book
Author : C. R. Brundle,Leslie Wilson, PhD,Charles A. Evans,Shaun Wilson,Geoff Wilson
Publisher : Gulf Professional Publishing
Release : 1992
ISBN : 9780750691680
Language : En, Es, Fr & De

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Book Description :

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

Applied Electron Spectroscopy for Chemical Analysis

Applied Electron Spectroscopy for Chemical Analysis Book
Author : Hassan Windawi,Floyd F.-L. Ho
Publisher : John Wiley & Sons
Release : 1982
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.

Characterization of Tribological Materials

Characterization of Tribological Materials Book
Author : William A. Glaeser
Publisher : Momentum Press
Release : 2010
ISBN : 160650181X
Language : En, Es, Fr & De

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Book Description :

Understanding the composition and structure of a surface is essential in understanding its frictional (Tribological) properties. This volume in the Materials Characterization series will focus on surface characterization, including roughness, hardness, coating thickness and bond strength. Advanced characterization methods are also covered for applications in magnetic recording media, rolling contact bearings and other high-tech systems. -- Reviews major physical principles of tribology, including adhesion, friction, abrasion and surface boundary conditions -- Special section on surface characterization of magnetic recording surfaces -- Concise summaries of major characterization technologies for tribological materials, including SEM, Energy-Dispersive X-Ray Spectroscopy, Fourier Transform Infrared Spectroscopy and Static Secondary Ion Mass Spectroscopy

Molecular Luminescence Spectroscopy Part 3

Molecular Luminescence Spectroscopy  Part 3 Book
Author : Stephen G. Schulman,I. M. Kolthoff
Publisher : Wiley-Interscience
Release : 1993-03-22
ISBN : 9780471515807
Language : En, Es, Fr & De

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Book Description :

Over the past three decades, luminescence spectroscopy has transcended its origins as a curiosity in the physical laboratory to become a widely used and respected staple of the analytical chemist's instrumentation arsenal. Fluorescence, chemiluminescence, and phosphorescence spectroscopies are now routinely applied to such real analytical problems as the quantitaion, qualitative identification, and structural characterization of organic and inorganic compounds and even of cellular structures. And the list of recent advances in analytical applications of luminescence spectroscopy keeps growing. The earlier volumes of Molecular Luminescence Spectroscopy provided professional chemists with a detailed, exhaustive, and up-to-date look at the applications of fluorescence, phosphorescence, and chemiluminescence spectra to the analysis of organic and inorganic compounds. Presenting topics never available in any analytical text, such as excited state optical activity and bioinorganic luminescence spectroscopy, the volumes represented a significant advance in the chemical literature. Part 3 continues the book's always current and practical examination of the field’s newest innovative turns. In a clear, systematic format, Part 3 discusses such widespread or ascendant laboratory techniques as: photochemically generated fluorophores fluorescent probes luminescence from bile salt aggregates hole-burning spectroscopy laser-excited microspectro-fluorometry near-infrared luminescence spectroscopy Other topics such as the fluorescence and phosphorescence of pharmaceuticals and natural products have never been reviewed as exhaustively before. The chapters on fluorescence detection in chromatography and luminescence immunoassay are the most up-to-date treatments available on these subjects. Invaluable to analytical chemists, instructors, and students, Molecular Luminescence Spectroscopy, Part 3 offers expert guidance on the practical specifics of this multi-faceted technique as well as its farreaching analytical possibilities.

Material Characterization Using Ion Beams

Material Characterization Using Ion Beams Book
Author : J. Thomas
Publisher : Springer
Release : 2012-11-25
ISBN : 9781468408584
Language : En, Es, Fr & De

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Book Description :

The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976.

Infrared Spectroscopy

Infrared Spectroscopy Book
Author : James M. Thompson
Publisher : Unknown
Release : 2018
ISBN : 9781351206006
Language : En, Es, Fr & De

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Book Description :

"It is estimated that there are about 10 million organic chemicals known, and about 100,000 new organic compounds are produced each year. Some of these new chemicals are made in the laboratory and some are isolated from natural products. The structural determination of these compounds is the job of the chemist. There are several instrumental techniques used to determine the structures of organic compounds. These include NMR, UV/visible, infrared spectroscopy, mass spectrometry, and X-ray crystallography. Of all the instrumental techniques listed, infrared spectroscopy and mass spectrometry are the two most popular techniques, mainly because they tend to be less expensive and give us the most structural information. This book is an introductory text designed to acquaint undergraduate and graduate students with the basic theory and interpretative techniques of infrared spectroscopy. Much of the material in this text has been used over a period of several years for teaching courses in materials characterization and chemical analysis. It presents the infrared spectra of the major classes of organic compounds and correlates the infrared bands (bond vibrations) of each spectrum with the structural features of the compound it represents. This has been done for hydrocarbons, organic acids, ketones, aldehydes, esters, anhydrides, phenols, amines, and amides. The text discusses the origin of the fragments, techniques, innovations, and applications in infrared spectroscopy. It is interspersed with many illustrations, examples, an adequate but not overwhelming bibliography, and problems for students. It will serve as a lecture text for a one-semester course in infrared spectroscopy or can be used to teach the infrared spectroscopy portion of a broader course in material characterization and chemical analysis."--Provided by publisher.

Characterization of Biomaterials

Characterization of Biomaterials Book
Author : T.S. Sampath Kumar
Publisher : Elsevier Inc. Chapters
Release : 2013-03-12
ISBN : 012807096X
Language : En, Es, Fr & De

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Book Description :

The physicochemical properties of biomaterials exert a major influence over their interaction with cells and subsequently play an important role on the materials' in vivo performance . Physical characteristics involve internal microstructural features, shape and size of particles, porosity, density, and surface area. Characterization in terms of the chemistry involves determination of the chemical composition and distribution of the elements within the biomaterial. The last decade has seen several innovations in the armory of tools to image and analyze materials, as well as advancement in the collection and processing of those results. In this chapter, the most commonly used methods, which are available for the microstructural characterization of biomaterials, are explained with suitable examples. This chapter starts with microstructural characterization using different types of microscopic techniques including optical and electron microscopy. These techniques can provide information from atomic-scale to microscale to macroscale information. Specific examples are also used for specialized microscopic techniques such as scanning probe microscopy and atomic force microscopy. Some discussions were also used in -related surface characterization using microscopic techniques. Followed by microscopic techniques, phase analysis techniques are discussed based on X-ray diffraction. Short discussion is also placed on infrared (IR)-based spectroscopic characterization for chemical analysis. Further discussion on IR spectroscopy can be found in for surface analysis. The last part of this chapter deals with size, shape, porosity, surface area and surface energy characterization. Particle size analysis by dynamic light scattering (DLS) is discussed in detail followed by IR spectroscopic analysis. Contact angle measurement for surface energy, mercury intrusion porosimetry for analysis of pore structures and gas adsorption measurements for surface area analysis are presented in detail with relevant examples. Throughout this chapter, specific discussions are focused on examples based on applications as well as advantages, disadvantages, and challenges.

X Ray Fluorescence Spectrometry

X Ray Fluorescence Spectrometry Book
Author : Ron Jenkins
Publisher : John Wiley & Sons
Release : 2012-08-29
ISBN : 1118521048
Language : En, Es, Fr & De

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Book Description :

X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: * The history of X-ray fluorescence spectrometry-new to this edition. * A critical review of the most useful X-ray spectrometers. * Techniques and procedures for quantitative and qualitative analysis. * Modern applications and industrial trends. * X-ray spectra-new to this edition.