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Architecture Design For Soft Errors

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Architecture Design for Soft Errors

Architecture Design for Soft Errors Book
Author : Shubu Mukherjee
Publisher : Morgan Kaufmann
Release : 2011-08-29
ISBN : 9780080558325
Language : En, Es, Fr & De

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Book Description :

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors Shows readers how to quantify their soft error reliability Provides state-of-the-art techniques to protect against soft errors

Soft Error Reliability Using Virtual Platforms

Soft Error Reliability Using Virtual Platforms Book
Author : Felipe Rocha da Rosa,Luciano Ost,Ricardo Reis
Publisher : Springer Nature
Release : 2020-11-02
ISBN : 3030557049
Language : En, Es, Fr & De

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Book Description :

This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

Soft Errors

Soft Errors Book
Author : Jean-Luc Autran,Daniela Munteanu
Publisher : CRC Press
Release : 2015-02-25
ISBN : 146659084X
Language : En, Es, Fr & De

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Book Description :

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Resilient Architecture Design for Voltage Variation

Resilient Architecture Design for Voltage Variation Book
Author : Vijay Janapa Reddi,Meeta Sharma Gupta
Publisher : Morgan & Claypool Publishers
Release : 2013-05-01
ISBN : 1608456382
Language : En, Es, Fr & De

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Book Description :

Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructs that can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency

Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems Book
Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
Release : 2010-09-24
ISBN : 9781441969934
Language : En, Es, Fr & De

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Book Description :

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Hardware and Software Verification and Testing

Hardware and Software  Verification and Testing Book
Author : Roderick Bloem,Eli Arbel
Publisher : Springer
Release : 2016-10-31
ISBN : 3319490524
Language : En, Es, Fr & De

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Book Description :

This book constitutes the refereed proceedings of the 12th International Haifa Verification Conference, HVC 2016, held in Haifa, Israel in November 2016. The 13 revised full papers and one tool paper presented were carefully reviewed and selected from 26 submissions. They are dedicated to advance the state of the art and state of the practice in verification and testing and are discussing future directions of testing and verification for hardware, software, and complex hybrid systems.

Exploring Memory Hierarchy Design with Emerging Memory Technologies

Exploring Memory Hierarchy Design with Emerging Memory Technologies Book
Author : Guangyu Sun
Publisher : Springer Science & Business Media
Release : 2013-09-18
ISBN : 3319006819
Language : En, Es, Fr & De

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Book Description :

This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the “memory wall.” The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named “Moguls” is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs.

Design and Test Technology for Dependable Systems on chip

Design and Test Technology for Dependable Systems on chip Book
Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
Publisher : IGI Global
Release : 2011-01-01
ISBN : 1609602145
Language : En, Es, Fr & De

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Book Description :

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Transactional Memory Foundations Algorithms Tools and Applications

Transactional Memory  Foundations  Algorithms  Tools  and Applications Book
Author : Rachid Guerraoui,Paolo Romano
Publisher : Springer
Release : 2014-12-29
ISBN : 331914720X
Language : En, Es, Fr & De

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Book Description :

The advent of multi-core architectures and cloud-computing has brought parallel programming into the mainstream of software development. Unfortunately, writing scalable parallel programs using traditional lock-based synchronization primitives is well known to be a hard, time consuming and error-prone task, mastered by only a minority of specialized programmers. Building on the familiar abstraction of atomic transactions, Transactional Memory (TM) promises to free programmers from the complexity of conventional synchronization schemes, simplifying the development and verification of concurrent programs, enhancing code reliability, and boosting productivity. Over the last decade TM has been subject to intense research on a broad range of aspects including hardware and operating systems support, language integration, as well as algorithms and theoretical foundations. On the industrial side, the major players of the software and hardware markets have been up-front in the research and development of prototypal products providing support for TM systems. This has recently led to the introduction of hardware TM implementations on mainstream commercial microprocessors and to the integration of TM support for the world’s leading open source compiler. In such a vast inter-disciplinary domain, the Euro-TM COST Action (IC1001) has served as a catalyzer and a bridge for the various research communities looking at disparate, yet subtly interconnected, aspects of TM. This book emerged from the idea having Euro-TM experts compile recent results in the TM area in a single and consistent volume. Contributions have been carefully selected and revised to provide a broad coverage of several fundamental issues associated with the design and implementation of TM systems, including their theoretical underpinnings and algorithmic foundations, programming language integration and verification tools, hardware supports, distributed TM systems, self-tuning mechanisms, as well as lessons learnt from building complex TM-based applications.

Energy Efficient Fault Tolerant Systems

Energy Efficient Fault Tolerant Systems Book
Author : Jimson Mathew,Rishad A. Shafik,Dhiraj K. Pradhan
Publisher : Springer Science & Business Media
Release : 2013-09-07
ISBN : 1461441935
Language : En, Es, Fr & De

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Book Description :

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

FPGAs and Parallel Architectures for Aerospace Applications

FPGAs and Parallel Architectures for Aerospace Applications Book
Author : Fernanda Kastensmidt,Paolo Rech
Publisher : Springer
Release : 2015-12-07
ISBN : 3319143522
Language : En, Es, Fr & De

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Book Description :

This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Computer Engineering and Technology

Computer Engineering and Technology Book
Author : Weixia Xu,Liquan Xiao,Jinwen Li,Chengyi Zhang
Publisher : Springer
Release : 2016-01-13
ISBN : 3662492830
Language : En, Es, Fr & De

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Book Description :

This book constitutes the refereed proceedings of the 19th CCF Conference on Computer Engineering and Technology, NCCET 2015, held in Hefei, China, in October 2015. The 18 papers presented were carefully reviewed and selected from 158 submissions. They are organized in topical sections on processor architecture; application specific processors; computer application and software optimization; technology on the horizon.

Symbolic Parallelization of Nested Loop Programs

Symbolic Parallelization of Nested Loop Programs Book
Author : Alexandru-Petru Tanase,Frank Hannig,Jürgen Teich
Publisher : Springer
Release : 2018-02-22
ISBN : 3319739093
Language : En, Es, Fr & De

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Book Description :

This book introduces new compilation techniques, using the polyhedron model for the resource-adaptive parallel execution of loop programs on massively parallel processor arrays. The authors show how to compute optimal symbolic assignments and parallel schedules of loop iterations at compile time, for cases where the number of available cores becomes known only at runtime. The compile/runtime symbolic parallelization approach the authors describe reduces significantly the runtime overhead, compared to dynamic or just‐in-time compilation. The new, on‐demand fault‐tolerant loop processing approach described in this book protects loop nests for parallel execution against soft errors.

Euro Par 2009 Parallel Processing

Euro Par 2009   Parallel Processing Book
Author : Henk Sips,Dick Epema,Hai-Xiang Lin
Publisher : Springer Science & Business Media
Release : 2009-08-17
ISBN : 3642038689
Language : En, Es, Fr & De

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Book Description :

This book constitutes the refereed proceedings of the 15th International Conference on Parallel Computing, Euro-Par 2009, held in Delft, The Netherlands, in August 2009. The 85 revised papers presented were carefully reviewed and selected from 256 submissions. The papers are organized in topical sections on support tools and environments; performance prediction and evaluation; scheduling and load balancing; high performance architectures and compilers; parallel and distributed databases; grid, cluster, and cloud computing; peer-to-peer computing; distributed systems and algorithms; parallel and distributed programming; parallel numerical algorithms; multicore and manycore programming; theory and algorithms for parallel computation; high performance networks; and mobile and ubiquitous computing.

Dependable Embedded Systems

Dependable Embedded Systems Book
Author : Jörg Henkel,Nikil Dutt
Publisher : Springer Nature
Release : 2020-12-09
ISBN : 303052017X
Language : En, Es, Fr & De

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Book Description :

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

VLSI Design and Test for Systems Dependability

VLSI Design and Test for Systems Dependability Book
Author : Shojiro Asai
Publisher : Springer
Release : 2018-07-20
ISBN : 4431565949
Language : En, Es, Fr & De

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Book Description :

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Terrestrial Neutron induced Soft Errors in Advanced Memory Devices

Terrestrial Neutron induced Soft Errors in Advanced Memory Devices Book
Author : Takashi Nakamura
Publisher : World Scientific
Release : 2008
ISBN : 9812778829
Language : En, Es, Fr & De

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Book Description :

There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients.The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike.

Terrestrial Neutron Induced Soft Errors in Advanced Memory Devices

Terrestrial Neutron Induced Soft Errors in Advanced Memory Devices Book
Author : Anonim
Publisher : Unknown
Release : 2021-09-24
ISBN : 9814472395
Language : En, Es, Fr & De

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Book Description :

Download Terrestrial Neutron Induced Soft Errors in Advanced Memory Devices book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Radiation Effects in Semiconductors

Radiation Effects in Semiconductors Book
Author : Krzysztof Iniewski
Publisher : CRC Press
Release : 2018-09-03
ISBN : 1351833758
Language : En, Es, Fr & De

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Book Description :

Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.