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Architecture Design For Soft Errors

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Architecture Design for Soft Errors

Architecture Design for Soft Errors Book
Author : Shubu Mukherjee
Publisher : Morgan Kaufmann
Release : 2011-08-29
ISBN : 9780080558325
Language : En, Es, Fr & De

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Book Description :

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors Shows readers how to quantify their soft error reliability Provides state-of-the-art techniques to protect against soft errors

Soft Errors

Soft Errors Book
Author : Jean-Luc Autran,Daniela Munteanu
Publisher : CRC Press
Release : 2015-02-25
ISBN : 146659084X
Language : En, Es, Fr & De

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Book Description :

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Soft Error Reliability Using Virtual Platforms

Soft Error Reliability Using Virtual Platforms Book
Author : Felipe Rocha da Rosa,Luciano Ost,Ricardo Reis
Publisher : Springer Nature
Release : 2020-11-02
ISBN : 3030557049
Language : En, Es, Fr & De

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Book Description :

This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems Book
Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
Release : 2010-09-24
ISBN : 9781441969934
Language : En, Es, Fr & De

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Book Description :

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Resilient Architecture Design for Voltage Variation

Resilient Architecture Design for Voltage Variation Book
Author : Vijay Janapa Reddi,Meeta Sharma Gupta
Publisher : Morgan & Claypool Publishers
Release : 2013-05-01
ISBN : 1608456382
Language : En, Es, Fr & De

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Book Description :

Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructs that can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency

Soft Error Reliability of VLSI Circuits

Soft Error Reliability of VLSI Circuits Book
Author : Behnam Ghavami,Mohsen Raji
Publisher : Springer Nature
Release : 2020-11-14
ISBN : 3030516105
Language : En, Es, Fr & De

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Book Description :

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

FPGAs and Parallel Architectures for Aerospace Applications

FPGAs and Parallel Architectures for Aerospace Applications Book
Author : Fernanda Kastensmidt,Paolo Rech
Publisher : Springer
Release : 2015-12-07
ISBN : 3319143522
Language : En, Es, Fr & De

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Book Description :

This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Achieving High Availability with Commodity Hardware and Software

Achieving High Availability with Commodity Hardware and Software Book
Author : Nidhi Aggarwal
Publisher : Unknown
Release : 2008
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Achieving High Availability with Commodity Hardware and Software book written by Nidhi Aggarwal, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

On Line Testing Workshop

On Line Testing Workshop Book
Author : Anonim
Publisher : IEEE
Release : 2002
ISBN : 9780769516417
Language : En, Es, Fr & De

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Book Description :

This text contains information on computer engineering as presented at the 8th IEEE International On-Line Testing Workshop (IOLTW 2002).

ISLPED 04

ISLPED 04 Book
Author : IEEE Circuits and Systems Society
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Release : 2004
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

"IEEE Catalog Number: 04TH8758"--T.p. verso.

On Line Testing Symposium 2003 IOLTS 2003 9th IEEE

On Line Testing Symposium  2003  IOLTS 2003  9th IEEE Book
Author : C. Metra
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Release : 2003
ISBN : 9780769519685
Language : En, Es, Fr & De

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Book Description :

Download On Line Testing Symposium 2003 IOLTS 2003 9th IEEE book written by C. Metra, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Efficient Techniques for Modeling and Mitigation of Soft Errors in Nanometer scale Static CMOS Logic Circuits

Efficient Techniques for Modeling and Mitigation of Soft Errors in Nanometer scale Static CMOS Logic Circuits Book
Author : Srivathsan Krishnamohan
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Efficient Techniques for Modeling and Mitigation of Soft Errors in Nanometer scale Static CMOS Logic Circuits book written by Srivathsan Krishnamohan, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Electronic Design

Electronic Design Book
Author : Anonim
Publisher : Unknown
Release : 1985
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Electronic Design book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

ACM SIGPLAN Notices

ACM SIGPLAN Notices Book
Author : Anonim
Publisher : Unknown
Release : 2006-07
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download ACM SIGPLAN Notices book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Dissertation Abstracts International

Dissertation Abstracts International Book
Author : Anonim
Publisher : Unknown
Release : 2008
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Dissertation Abstracts International book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Proceedings

Proceedings Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Proceedings book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

PowerPC concepts Architecture and Design

PowerPC  concepts  Architecture  and Design Book
Author : Dipto Chakravarty,Casey Cannon
Publisher : Computing McGraw-Hill
Release : 1994
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

The Power PC microprocessor provides a combination of high performance, small size, low power consumption and low price, which makes it suitable for a variety of computer applications - from hand-held computers to multimedia desktop computers to IBM's RS/6000 workstation.

XII Symposium on Integrated Circuits and Systems Design

XII Symposium on Integrated Circuits and Systems Design Book
Author : Sociedade Brasileira de Computação,IFIP WG 10.5
Publisher : IEEE
Release : 1999
ISBN : 9780769503875
Language : En, Es, Fr & De

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Book Description :

Topics in these conference papers include: microprecessors design; modelling; co-design; analog design; high-level syntheis; digital design; synthesis and reconfiguration; CAD tools; and IP cores."

Advances in Computer Systems Architecture

Advances in Computer Systems Architecture Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

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SBCCI 2007

SBCCI 2007 Book
Author : Antonio Petraglia
Publisher : Unknown
Release : 2007
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download SBCCI 2007 book written by Antonio Petraglia, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.