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Advanced Metrology

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Advanced Metrology

Advanced Metrology Book
Author : X. Jane Jiang,Paul J. Scott
Publisher : Academic Press
Release : 2020-04-08
ISBN : 0128218169
Language : En, Es, Fr & De

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Book Description :

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software

Advanced Nanoscale ULSI Interconnects Fundamentals and Applications

Advanced Nanoscale ULSI Interconnects  Fundamentals and Applications Book
Author : Yosi Shacham-Diamand,Tetsuya Osaka,Madhav Datta,Takayuki Ohba
Publisher : Springer Science & Business Media
Release : 2009-09-19
ISBN : 0387958681
Language : En, Es, Fr & De

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Book Description :

In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation of modern electronics system create a strong demand for new and improved electronic circuits as demonstrated by the amazing progress in the ?eld of ULSI technology. This progress is well described by the famous “Moore’s law” which states, in its most general form, that all the metrics that describe integrated circuit performance (e. g. , speed, number of devices, chip area) improve expon- tially as a function of time. For example, the number of components per chip d- bles every 18 months and the critical dimension on a chip has shrunk by 50% every 2 years on average in the last 30 years. This rapid growth in integrated circuits te- nology results in highly complex integrated circuits with an increasing number of interconnects on chips and between the chip and its package. The complexity of the interconnect network on chips involves an increasing number of metal lines per interconnect level, more interconnect levels, and at the same time a reduction in the interconnect line critical dimensions.

Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics Book
Author : Zhiyong Ma,David G. Seiler
Publisher : CRC Press
Release : 2017-03-27
ISBN : 135173394X
Language : En, Es, Fr & De

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Book Description :

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Microelectronics Manufacturing Diagnostics Handbook

Microelectronics Manufacturing Diagnostics Handbook Book
Author : Abraham Landzberg
Publisher : Springer Science & Business Media
Release : 2012-12-06
ISBN : 1461520290
Language : En, Es, Fr & De

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Book Description :

The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.

An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories

An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories Book
Author : National Research Council,Division on Engineering and Physical Sciences,Board on Assessment of NIST Programs
Publisher : National Academies Press
Release : 2002-09-26
ISBN : 9780309182676
Language : En, Es, Fr & De

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Book Description :

This assessment of the technical quality and relevance of the programs of the Measurement and Standards Laboratories of the National Institute of Standards and Technology is the work of the 165 members of the National Research Council's (NRC's) Board on Assessment of NIST Programs and its panels. These individuals were chosen by the NRC for their technical expertise, their practical experience in running research programs, and their knowledge of industry's needs in basic measurements and standards. This assessment addresses the following: - The technical merit of the laboratory programs relative to the state of the art worldwide; - The effectiveness with which the laboratory programs are carried out and the results disseminated to their customers; - The relevance of the laboratory programs to the needs of their customers; and - The ability of the laboratories' facilities, equipment, and human resources to enable the laboratories to fulfill their mission and meet their customers' needs.

Technologies and Applications for Big Data Value

Technologies and Applications for Big Data Value Book
Author : Edward Curry
Publisher : Springer Nature
Release : 2022-07-01
ISBN : 3030783073
Language : En, Es, Fr & De

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Book Description :

Download Technologies and Applications for Big Data Value book written by Edward Curry, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Digital Conversion on the Way to Industry 4 0

Digital Conversion on the Way to Industry 4 0 Book
Author : Numan M. Durakbasa,M. Güneş Gençyılmaz
Publisher : Springer Nature
Release : 2020-11-26
ISBN : 3030627845
Language : En, Es, Fr & De

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Book Description :

This book presents the proceedings from the International Symposium for Production Research 2020. The cross-disciplinary papers presented draw on research from academics and practitioners from industrial engineering, management engineering, operational research, and production/operational management. It explores topics including: · computer-aided manufacturing; Industry 4.0 applications; simulation and modeling big data and analytics; flexible manufacturing systems; decision analysis quality management industrial robotics in production systems information technologies in production management; and optimization techniques. Presenting real-life applications, case studies, and mathematical models, this book is of interest to researchers, academics, and practitioners in the field of production and operation engineering.

Hybrid Machining

Hybrid Machining Book
Author : Xichun Luo,Yi Qin
Publisher : Academic Press
Release : 2018-06-27
ISBN : 0128131136
Language : En, Es, Fr & De

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Book Description :

Hybrid Machining: Theory, Methods, and Case Studies covers the scientific fundamentals, techniques, applications and real-world descriptions of emerging hybrid machining technology. This field is advancing rapidly in industrial and academic contexts, creating a great need for the fundamental and technical guidance that this book provides. The book includes discussions of basic concepts, process design principles, standard hybrid machining processes, multi-scale modeling approaches, design, on-machine metrology and work handling systems. Readers interested in manufacturing systems, product design or machining technology will find this one-stop guide to hybrid machining the ideal reference. Includes tables of recommended processing parameters for key engineering materials/products for each hybrid machining process Provides case studies covering real industrial applications Explains how to use multiscale modeling for hybrid machining

Optical Inspection of Microsystems Second Edition

Optical Inspection of Microsystems  Second Edition Book
Author : Wolfgang Osten
Publisher : CRC Press
Release : 2019-06-21
ISBN : 0429532652
Language : En, Es, Fr & De

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Book Description :

Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS

An Assessment of the Communications Technology Laboratory at the National Institute of Standards and Technology

An Assessment of the Communications Technology Laboratory at the National Institute of Standards and Technology Book
Author : National Academies of Sciences, Engineering, and Medicine,Division on Engineering and Physical Sciences,Laboratory Assessments Board,Panel on Review of the National Institute of Standards and Technologyâ¬"s Communications Technology Laboratory
Publisher : National Academies Press
Release : 2019-12-03
ISBN : 0309498988
Language : En, Es, Fr & De

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Book Description :

An Assessment of the Communications Technology Laboratory at the National Institute of Standards and Technology: Fiscal Year 2019 is an independent technical assessment of the quality of the National Institute of Standards and Technology's (NIST's) Communications Technology Laboratory (CTL). It reviews the organization's technical programs, the portfolio of scientific expertise within the organization, the adequacy of the organization's facilities, equipment, and human resources, and the effectiveness by which the organization disseminates its program outputs. This report focuses on CTL priority areas such as public safety communications, trusted spectrum testing, and Next Generation Wireless (5G and Beyond). It also assesses the extent to which CTL applied the recommendations from a 2015 National Academies' report, which describes many of the critical uses of radio communications, provides lab-specific recommendations, and highlights important research priorities for the Boulder, Colorado communications technology laboratory of the Department of Commerce laboratory. This new report also describes the current activities of the Boulder telecommunications laboratories, its strengths and weaknesses as an organization, and its plans for the near future

Guide to NIST National Institute of Standards and Technology

Guide to NIST  National Institute of Standards and Technology  Book
Author : DIANE Publishing Company
Publisher : DIANE Publishing
Release : 1997-07
ISBN : 9780788146237
Language : En, Es, Fr & De

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Book Description :

Gathers in one place descriptions of NIST's many programs, products, services, and research projects, along with contact names, phone numbers, and e-mail and World Wide Web addresses for further information. It is divided into chapters covering each of NIST's major operating units. In addition, each chapter on laboratory programs includes subheadings for NIST organizational division or subject areas. Covers: electronics and electrical engineering; manufacturing engineering; chemical science and technology; physics; materials science and engineering; building and fire research and information technology.

Quality Today

Quality Today Book
Author : Anonim
Publisher : Unknown
Release : 2005
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Quality Today book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Modeling Characterization and Production of Nanomaterials

Modeling  Characterization and Production of Nanomaterials Book
Author : V Tewary,Y Zhang
Publisher : Elsevier
Release : 2015-03-17
ISBN : 1782422358
Language : En, Es, Fr & De

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Book Description :

Nano-scale materials have unique electronic, optical, and chemical properties which make them attractive for a new generation of devices. Part one of Modeling, Characterization, and Production of Nanomaterials: Electronics, Photonics and Energy Applications covers modeling techniques incorporating quantum mechanical effects to simulate nanomaterials and devices, such as multiscale modeling and density functional theory. Part two describes the characterization of nanomaterials using diffraction techniques and Raman spectroscopy. Part three looks at the structure and properties of nanomaterials, including their optical properties and atomic behaviour. Part four explores nanofabrication and nanodevices, including the growth of graphene, GaN-based nanorod heterostructures and colloidal quantum dots for applications in nanophotonics and metallic nanoparticles for catalysis applications. Comprehensive coverage of the close connection between modeling and experimental methods for studying a wide range of nanomaterials and nanostructures Focus on practical applications and industry needs, supported by a solid outlining of theoretical background Draws on the expertise of leading researchers in the field of nanomaterials from around the world

Review of the Fiscal Year 1999 Administration Request for the Technology Administration and the National Institute of Standards and Technology

Review of the Fiscal Year 1999 Administration Request for the Technology Administration and the National Institute of Standards and Technology Book
Author : United States,United States Government Printing Office,United States. Congress. House. Committee on Science. Subcommittee on Technology
Publisher : Unknown
Release : 1998
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Review of the Fiscal Year 1999 Administration Request for the Technology Administration and the National Institute of Standards and Technology book written by United States,United States Government Printing Office,United States. Congress. House. Committee on Science. Subcommittee on Technology, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Commerce Justice Science and Related Agencies Appropriations for 2015

Commerce  Justice  Science  and Related Agencies Appropriations for 2015 Book
Author : United States. Congress. House. Committee on Appropriations. Subcommittee on Commerce, Justice, Science, and Related Agencies
Publisher : Unknown
Release : 2014
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Commerce Justice Science and Related Agencies Appropriations for 2015 book written by United States. Congress. House. Committee on Appropriations. Subcommittee on Commerce, Justice, Science, and Related Agencies, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Integrated Circuit Metrology Inspection and Process Control II

Integrated Circuit Metrology  Inspection  and Process Control II Book
Author : Kevin M. Monahan
Publisher : Society of Photo Optical
Release : 1988
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Integrated Circuit Metrology Inspection and Process Control II book written by Kevin M. Monahan, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Departments of Commerce Justice and State the Judiciary and Related Agencies Appropriations for 1998

Departments of Commerce  Justice  and State  the Judiciary  and Related Agencies Appropriations for 1998 Book
Author : United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies
Publisher : Unknown
Release : 1997
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Departments of Commerce Justice and State the Judiciary and Related Agencies Appropriations for 1998 book written by United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

Secretary of Commerce

Secretary of Commerce Book
Author : United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies
Publisher : Unknown
Release : 1997
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download Secretary of Commerce book written by United States. Congress. House. Committee on Appropriations. Subcommittee on the Departments of Commerce, Justice, and State, the Judiciary, and Related Agencies, available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.

The Next Production Revolution

The Next Production Revolution Book
Author : Collectif
Publisher : OECD
Release : 2017-05-10
ISBN : 9264271155
Language : En, Es, Fr & De

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Book Description :

This publication examines the opportunities and challenges, for business and government, associated with technologies bringing about the “next production revolution”. These include a variety of digital technologies (e.g. the Internet of Things and advanced robotics), industrial biotechnology, 3D printing, new materials and nanotechnology. Some of these technologies are already used in production, while others will be available in the near future. All are developing rapidly. As these technologies transform the production and the distribution of goods and services, they will have far-reaching consequences for productivity, skills, income distribution, well-being and the environment. The more that governments and firms understand how production could develop in the near future, the better placed they will be to address the risks and reap the benefits.

NBS Special Publication

NBS Special Publication Book
Author : Anonim
Publisher : Unknown
Release : 1918
ISBN : 0987650XXX
Language : En, Es, Fr & De

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Book Description :

Download NBS Special Publication book written by , available in PDF, EPUB, and Kindle, or read full book online anywhere and anytime. Compatible with any devices.